
Proceedings Paper
Combination of skip-flat test with Ritchey-Common test for the large rectangular flatFormat | Member Price | Non-Member Price |
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Paper Abstract
The Skip-Flat test and Ritchey-Common test are the well-known methods for large flat mirrors measurement. This paper
describes the theories of two methods. The combination of the Skip-Flat test with Ritchey-Common test is proposed.
Simulations and experiments of the combination method for testing the large rectangular flat of high aspect ratio are
shown. The results of the combination test and direct measurement are presented. In comparison of the methods, the
combination test is in good agreement with the direct measurement.
Paper Details
Date Published: 12 October 2010
PDF: 6 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76564W (12 October 2010); doi: 10.1117/12.867490
Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)
PDF: 6 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76564W (12 October 2010); doi: 10.1117/12.867490
Show Author Affiliations
Linchao Zhang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of Chinese Academy of Sciences (China)
Bin Xuan, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of Chinese Academy of Sciences (China)
Graduate School of Chinese Academy of Sciences (China)
Bin Xuan, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Graduate School of Chinese Academy of Sciences (China)
Jingjiang Xie, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)
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