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Proceedings Paper

Characterization of preform raw materials for high power fiber lasers using LID absorption measurement technique
Author(s): Ch. Mühlig; S. Bublitz; St. Grimm; A. Langner; G. Schötz
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Paper Abstract

Two different concepts are introduced and compared to measure for the first time residual absorption in pure and doped fused silica fiber preform raw materials at 940 nm and 1550nm directly by means of the laser induced deflection (LID) technique in order to analyze the minimal achievable attenuation in high power fiber lasers based on the doped fused silica raw materials. It is found, that attaching a thin disk sample of the preform raw material to a practically non-absorbing substrate at the wavelength of investigation is the best measurement concept with respect to material consumption, absolute calibration and impact of the strong scattering in the doped raw materials on the measurement. For several Yb doped laser active raw materials the initial absorption value at 1550 nm (ranging from less than 50 dB/km to about 1800 dB/km) is compared to the total loss achieved for the manufactured fiber at 1200 nm, 1315 nm and 1600 nm, respectively. For some of the chosen materials the fiber loss is very comparable to residual raw material absorption indicating that the initial absorption is the dominant loss mechanism in the manufactured fiber. In contrast, for some fibers the total loss exceeds the values of the raw material absorption which allows the conclusion that additional loss mechanism like scattering, stress, geometrically fluctuation and micro or macro bending contributes to the fiber attenuation.

Paper Details

Date Published: 29 November 2010
PDF: 6 pages
Proc. SPIE 7842, Laser-Induced Damage in Optical Materials: 2010, 78421M (29 November 2010); doi: 10.1117/12.867230
Show Author Affiliations
Ch. Mühlig, IPHT Jena (Germany)
S. Bublitz, IPHT Jena (Germany)
St. Grimm, IPHT Jena (Germany)
A. Langner, Heraeus Quarzglas GmbH & Co. KG (Germany)
G. Schötz, Heraeus Quarzglas GmbH & Co. KG (Germany)

Published in SPIE Proceedings Vol. 7842:
Laser-Induced Damage in Optical Materials: 2010
Gregory J. Exarhos; Vitaly E. Gruzdev; Joseph A. Menapace; Detlev Ristau; M. J. Soileau, Editor(s)

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