
Proceedings Paper
New filtering method for GPS/INS integrated navigationFormat | Member Price | Non-Member Price |
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Paper Abstract
The error caused by linearization in the filtering process is an important factor that decrease the filtering accuracy, and if
the error exceeds the allowable range it may result in filter divergence for some highly nonlinear systems. In the
GPS/INS system integrated with position and velocity, though the linearization process is eliminated because of its linear
model, the navigation accuracy is degraded by the correlation between the system's measurements. So the integration of
range was adopted for observation model, which makes use of the original measurements of GPS, so it can improve the
navigation accuracy. As this observation model is nonlinear, for the high accuracy requirement of GPS/INS integrated
navigation system, the UPF (Unscented Particle Filter) algorithm was introduced to estimate the system states. The UPF
is a nonlinear filer which is more suitable for nonlinear systems. The simulation was carried out under the condition of
less than four GPS satellites data available, the results of which show that the estimated values with UPF are quite close
to real values, and the UPF algorithm has a very good performance when it applied in the GPS/INS integrated
navigation.
Paper Details
Date Published: 20 August 2010
PDF: 8 pages
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782038 (20 August 2010); doi: 10.1117/12.867204
Published in SPIE Proceedings Vol. 7820:
International Conference on Image Processing and Pattern Recognition in Industrial Engineering
Shaofei Wu; Zhengyu Du; Shaofei Wu; Zhengyu Du; Shaofei Wu; Zhengyu Du, Editor(s)
PDF: 8 pages
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 782038 (20 August 2010); doi: 10.1117/12.867204
Show Author Affiliations
Xiao-chun Zhong, Southwest Jiaotong Univ. (China)
Tao Song, Southwest Jiaotong Univ. (China)
Published in SPIE Proceedings Vol. 7820:
International Conference on Image Processing and Pattern Recognition in Industrial Engineering
Shaofei Wu; Zhengyu Du; Shaofei Wu; Zhengyu Du; Shaofei Wu; Zhengyu Du, Editor(s)
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