
Proceedings Paper
Improving example-based super-resolution via clustering training setsFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
More image patches in a training set making it more time-consuming has become a holdback of the real-time application
of example-based super-resolution. The paper proposes a method which clusters these training set to accelerate the
procedure. Before the super-resolution, a clustering method is used to partition the middle-frequency components in the
training set into some subsets. During super-resolution, the distances between each matching patch of low-resolution
image and each subset of training set are computed. The subset with the minimum distance is selected to carry out farther
matching. This procedure goes along until a most matching patch is found. The high-frequency patch within the training
set relevant to the found matching patch is selected as the researching output, which is used for super-resolution of
objective image. Two examples are use to illustrate the performance of the proposed algorithm, one using a factitious
image obtained by blurring and down-sampling an original image, and another using directly a true image. The results
show the proposed method can reduce effectively the computational complexity.
Paper Details
Date Published: 20 August 2010
PDF: 7 pages
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202V (20 August 2010); doi: 10.1117/12.867100
Published in SPIE Proceedings Vol. 7820:
International Conference on Image Processing and Pattern Recognition in Industrial Engineering
Shaofei Wu; Zhengyu Du; Shaofei Wu; Zhengyu Du; Shaofei Wu; Zhengyu Du, Editor(s)
PDF: 7 pages
Proc. SPIE 7820, International Conference on Image Processing and Pattern Recognition in Industrial Engineering, 78202V (20 August 2010); doi: 10.1117/12.867100
Show Author Affiliations
Qinlan Xie, South-Central Univ. for Nationalities (China)
Hong Chen, South-Central Univ. for Nationalities (China)
Published in SPIE Proceedings Vol. 7820:
International Conference on Image Processing and Pattern Recognition in Industrial Engineering
Shaofei Wu; Zhengyu Du; Shaofei Wu; Zhengyu Du; Shaofei Wu; Zhengyu Du, Editor(s)
© SPIE. Terms of Use
