
Proceedings Paper
Correction method for the error of diamond tool's radius in ultra-precision cuttingFormat | Member Price | Non-Member Price |
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Paper Abstract
The compensation method for the error of diamond tool's cutting edge is a bottle-neck technology to hinder the high accuracy aspheric surface's directly formation after single diamond turning. Traditional compensation was done according to the measurement result from profile meter, which took long measurement time and caused low processing efficiency. A new compensation
method was firstly put forward in the article, in which the correction of the error of diamond tool's cutting edge was done according to measurement result from digital interferometer. First, detailed theoretical calculation related with compensation method was deduced. Then, the effect after compensation was simulated by computer. Finally, φ50 mm work piece finished its diamond turning and new correction turning under Nanotech 250. Testing surface achieved high shape accuracy pv 0.137λ and rms=0.011λ, which approved the new compensation method agreed with predictive analysis, high accuracy and fast speed of error convergence.
Paper Details
Date Published: 6 October 2010
PDF: 8 pages
Proc. SPIE 7655, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 765539 (6 October 2010); doi: 10.1117/12.866751
Published in SPIE Proceedings Vol. 7655:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Yoshiharu Namba; David D. Walker; Shengyi Li, Editor(s)
PDF: 8 pages
Proc. SPIE 7655, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 765539 (6 October 2010); doi: 10.1117/12.866751
Show Author Affiliations
Yi Wang M.D., Soochow Univ. (China)
Jing-chi Yu, Soochow Univ. (China)
Published in SPIE Proceedings Vol. 7655:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Yoshiharu Namba; David D. Walker; Shengyi Li, Editor(s)
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