
Proceedings Paper
Dwell time algorithm based on the optimization theory for magnetorheological finishingFormat | Member Price | Non-Member Price |
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Paper Abstract
Magnetorheological finishing (MRF) is an advanced polishing technique capable of rapidly converging to the required
surface figure. This process can deterministically control the amount of the material removed by varying a time to dwell
at each particular position on the workpiece surface. The dwell time algorithm is one of the most important key
techniques of the MRF. A dwell time algorithm based on the1 matrix equation and optimization theory was presented in
this paper. The conventional mathematical model of the dwell time was transferred to a matrix equation containing initial
surface error, removal function and dwell time function. The dwell time to be calculated was just the solution to the
large, sparse matrix equation. A new mathematical model of the dwell time based on the optimization theory was
established, which aims to minimize the 2-norm or ∞-norm of the residual surface error. The solution meets almost all
the requirements of precise computer numerical control (CNC) without any need for extra data processing, because this
optimization model has taken some polishing condition as the constraints. Practical approaches to finding a minimal
least-squares solution and a minimal maximum solution are also discussed in this paper. Simulations have shown that the
proposed algorithm is numerically robust and reliable. With this algorithm an experiment has been performed on the
MRF machine developed by ourselves. After 4.7 minutes' polishing, the figure error of a flat workpiece with a 50 mm
diameter is improved by PV from 0.191λ(λ = 632.8 nm) to 0.087λ and RMS 0.041λ to 0.010λ. This algorithm can be constructed to polish workpieces of all shapes including flats, spheres, aspheres, and prisms, and it is capable of
improving the polishing figures dramatically.
Paper Details
Date Published: 6 October 2010
PDF: 6 pages
Proc. SPIE 7655, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 76551V (6 October 2010); doi: 10.1117/12.866396
Published in SPIE Proceedings Vol. 7655:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Yoshiharu Namba; David D. Walker; Shengyi Li, Editor(s)
PDF: 6 pages
Proc. SPIE 7655, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 76551V (6 October 2010); doi: 10.1117/12.866396
Show Author Affiliations
Yunfei Zhang, China Academy of Engineering Physics (China)
Yang Wang, China Academy of Engineering Physics (China)
Yajun Wang, China Academy of Engineering Physics (China)
Yang Wang, China Academy of Engineering Physics (China)
Yajun Wang, China Academy of Engineering Physics (China)
Jianguo He, China Academy of Engineering Physics (China)
Fang Ji, China Academy of Engineering Physics (China)
Wen Huang, China Academy of Engineering Physics (China)
Fang Ji, China Academy of Engineering Physics (China)
Wen Huang, China Academy of Engineering Physics (China)
Published in SPIE Proceedings Vol. 7655:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Yoshiharu Namba; David D. Walker; Shengyi Li, Editor(s)
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