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Proceedings Paper

Distributed fiber optic stress sensor system based on P-OFDR
Author(s): Zhiyong Dai; Xiaoxia Zhang; Zengshou Peng; Jianfeng Li; Zhonghua Ou; Yongzhi Liu
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Paper Abstract

We first proposed and demonstrated a distributed fiber sensor with high spatial resolution for detecting and locating distributed stress. The sensor system consists of a section polarization-maintaining fiber (PMF) and an optical frequency domain reflectometry (OFDR). The PMF used as sensing element and the polarization mode coupling loss in PM fiber resulting from the external stress would produce. Through monitoring the backscattered light with the distributed polarization mode coupling loss along the PMF under test, the distributed fiber optic stress sensor based on polarizationsensitive OFDR (P-OFDR) was obtained. In our experiment, a tunable single frequency fiber ring laser with narrow linewidth was developed to act as scanning frequency light source, and then the P-OFDR system was structured. The fiber laser and the distributed fiber sensor system have been investigated experimentally in detail. The experimental results show that its spatial resolution is about 5cm, the sensitivity is less than -80dBm and the maximum dynamic range are about 70dB. With advantages of high spatial resolution, high sensitivity and large dynamic range due to extremely narrow linewidth and heterodyne detection, this distributed fiber optic stress sensor has a number of potential applications for smart structure, structural health monitoring, defense and security monitoring.

Paper Details

Date Published: 12 October 2010
PDF: 6 pages
Proc. SPIE 7659, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Smart Structures and Materials in Manufacturing and Testing, 765914 (12 October 2010); doi: 10.1117/12.866062
Show Author Affiliations
Zhiyong Dai, Univ. of Electronic Science and Technology of China (China)
Xiaoxia Zhang, Univ. of Electronic Science and Technology of China (China)
Zengshou Peng, Univ. of Electronic Science and Technology of China (China)
Jianfeng Li, Univ. of Electronic Science and Technology of China (China)
Zhonghua Ou, Univ. of Electronic Science and Technology of China (China)
Yongzhi Liu, Univ. of Electronic Science and Technology of China (China)


Published in SPIE Proceedings Vol. 7659:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Smart Structures and Materials in Manufacturing and Testing
Xiangang Luo; Georg von Freymann, Editor(s)

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