
Proceedings Paper
Features of the reference laser signal in the space-borne Fourier Transform SpectrometerFormat | Member Price | Non-Member Price |
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Paper Abstract
The laser reference path serves as the measure standard of the movable mirror displacement and
velocity in Fourier Transform Spectrometer (FTS). In the Space-borne Imaging FTS, whose
movable mirror is plane, it is also used to measure the tilt of the mirror. So, the quality of the laser
interference signal plays an importance role in the instrument. This paper discusses and analyzes
the features of the reference laser signal mainly according to the experiment results.
Paper Details
Date Published: 6 October 2010
PDF: 9 pages
Proc. SPIE 7655, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 765520 (6 October 2010); doi: 10.1117/12.865816
Published in SPIE Proceedings Vol. 7655:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Yoshiharu Namba; David D. Walker; Shengyi Li, Editor(s)
PDF: 9 pages
Proc. SPIE 7655, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 765520 (6 October 2010); doi: 10.1117/12.865816
Show Author Affiliations
Huandong Wei, Shanghai Institute of Technical Physics (China)
Graduate Univ. of Chinese Academy of Sciences (China)
Jianwen Hua, Shanghai Institute of Technical Physics (China)
Zuoxiao Dai, Shanghai Institute of Technical Physics (China)
Graduate Univ. of Chinese Academy of Sciences (China)
Jianwen Hua, Shanghai Institute of Technical Physics (China)
Zuoxiao Dai, Shanghai Institute of Technical Physics (China)
Ren Chen, Shanghai Institute of Technical Physics (China)
Graduate Univ. of Chinese Academy of Sciences (China)
Xiaojie Sun, Shanghai Institute of Technical Physics (China)
Graduate Univ. of Chinese Academy of Sciences (China)
Graduate Univ. of Chinese Academy of Sciences (China)
Xiaojie Sun, Shanghai Institute of Technical Physics (China)
Graduate Univ. of Chinese Academy of Sciences (China)
Published in SPIE Proceedings Vol. 7655:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
Li Yang; Yoshiharu Namba; David D. Walker; Shengyi Li, Editor(s)
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