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Proceedings Paper

MMIC technology for spectroscopy applications
Author(s): Ingmar Kallfass; Axel Tessmann; A. Huelsmann; Arnulf Leuther; John S. Cetnar; Jade M. Noble; Douglas T. Petkie
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Paper Abstract

Millimeter-wave monolithic integrated circuit (MMIC) technology is now widely recognized as a key to many modern applications in safety and security, ranging from near and far-field imaging and sensing to non-invasive material inspection. In this paper, we apply our state-of-the-art MMIC technology to the analysis of gaseous media by spectroscopic techniques. The paper presents recent developments of amplifying and frequency-translating MMICs based on metamorphic HEMT technology and their application to the spectroscopic analysis of the frequency range from 250 to 330 GHz, including the important absorption line of water around 321 GHz.

Paper Details

Date Published: 8 October 2010
PDF: 11 pages
Proc. SPIE 7837, Millimetre Wave and Terahertz Sensors and Technology III, 783703 (8 October 2010); doi: 10.1117/12.865054
Show Author Affiliations
Ingmar Kallfass, Fraunhofer-Institut für Angewandte Festkörperphysik (Germany)
Axel Tessmann, Fraunhofer-Institut für Angewandte Festkörperphysik (Germany)
A. Huelsmann, Fraunhofer-Institut für Angewandte Festkörperphysik (Germany)
Arnulf Leuther, Fraunhofer-Institut für Angewandte Festkörperphysik (Germany)
John S. Cetnar, Wright State Univ. (United States)
Jade M. Noble, Wright State Univ. (United States)
Douglas T. Petkie, Wright State Univ. (United States)

Published in SPIE Proceedings Vol. 7837:
Millimetre Wave and Terahertz Sensors and Technology III
Keith A. Krapels; Neil A. Salmon, Editor(s)

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