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Proceedings Paper

CHRISTINE: code for high resolution satellite mapping of optical thickness and of Ångstrom exponent
Author(s): Nicolaos I. Sifakis; Christos Iossifidis; Charalambos Kontoes
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Paper Abstract

According to the "contrast reduction" principle the aerosol optical thickness (AOT) can be retrieved and mapped over heterogeneous (such as urban) areas using a set of two satellite images of high spatial resolution: (i) one "reference image" with minimum aerosol content involving negligible AOT, and (ii) one "polluted image" with AOT to be assessed. AOT values retrieved in this way are thus relative to the reference image, and could be miscalculated when other than atmospheric changes have taken place in the time between the acquisitions of the two images. Previously developed DTA and SMA image processing codes are subject to this potential source of AOT miscalculation because the contrast reduction is applied to single spectral bands. The new CHRISTINE code takes into consideration contrast reduction in more than one spectral band and uses the Angstrom's power law to isolate atmospheric effects attributable to aerosols. Preliminary testing of the new code over the Athens urban area against results obtained using the previous codes showed a considerable improvement in terms of the area over which AOT can be retrieved with high confidence. CHRISTINE has also a complementary feature of providing information on the aerosol size distribution emerging from Angstrom coefficient approximation.

Paper Details

Date Published: 27 October 2010
PDF: 13 pages
Proc. SPIE 7827, Remote Sensing of Clouds and the Atmosphere XV, 78270G (27 October 2010); doi: 10.1117/12.864453
Show Author Affiliations
Nicolaos I. Sifakis, National Observatory of Athens (Greece)
Christos Iossifidis, National Technical Univ. of Athens (Greece)
Charalambos Kontoes, National Observatory of Athens (Greece)

Published in SPIE Proceedings Vol. 7827:
Remote Sensing of Clouds and the Atmosphere XV
Richard H. Picard; Klaus Schäfer; Adolfo Comeron; Michiel van Weele, Editor(s)

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