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Proceedings Paper

Demonstrations of beam quality of semiconductor lasers
Author(s): Changqing Cao; Xiaodong Zeng; Yuying An
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Paper Abstract

Based on the beam characteristics of semiconductor lasers, a new parameter for evaluating beam quality of semiconductor lasers is introduced. The shortcomings of M2 factor used in evaluating beam quality of semiconductor lasers are discussed and its limitations are pointed out. Moreover, some important aspects of the beam quality factor are discussed. The main factors to influence collimating the beam of semiconductor lasers are analyzed. Our results give us grounds to make the following conclusions: the new propagation parameter succeeds in its universality and adaptability.

Paper Details

Date Published: 12 November 2010
PDF: 5 pages
Proc. SPIE 7844, Semiconductor Lasers and Applications IV, 78441C (12 November 2010); doi: 10.1117/12.864421
Show Author Affiliations
Changqing Cao, Xidian Univ. (China)
Xiaodong Zeng, Xidian Univ. (China)
Yuying An, Xidian Univ. (China)

Published in SPIE Proceedings Vol. 7844:
Semiconductor Lasers and Applications IV
Ning-Hua Zhu; Jinmin Li; Farzin Amzajerdian; Hiroyuki Suzuki, Editor(s)

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