
Proceedings Paper
Simultaneous determination of benzo[k]fluoranthene and perylene using excitation-emission matrix fluorescenceFormat | Member Price | Non-Member Price |
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Paper Abstract
Benzo[k]fluoranthene (BkF) and perylene (Per) are among the sixteen priority pollutants of polycyclic aromatic
hydrocarbons recommended by The United States Environment Protection Agency (EPA). In this paper, we report a
simple and rapid method for quantitative analysis of BkF and Per using the three-dimensional excitation-emission matrix
(EEM) fluorescence coupled with parallel factor analysis (PARAFAC). Before analyzing of two mixtures quantitatively,
we study the fluorescence characterization of pure BkF and Per first. The maximal peak values are at 306 nm of the
excitation wavelength and 406 nm of the emission wavelength for BkF, and 252 and 438nm for Per, the linear ranges of
BkF and Per are 0.8~16~ L-1 and 0.6~20~ L-1 respectively. Finally the average recoveries are obtained using
PARAFAC algorithm, which can reach 101.1% and 99.5% for BkF and Per respectively. In order to evaluate the
accuracy of the PARAFAC algorithm, selectivity (SEL) and sensitivity (SEN) have also been presented. Results show
that a good performance has been achieved using excitation-emission fluorescence coupled with PARAFAC algorithm.
Paper Details
Date Published: 11 October 2010
PDF: 6 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76561F (11 October 2010); doi: 10.1117/12.863816
Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)
PDF: 6 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76561F (11 October 2010); doi: 10.1117/12.863816
Show Author Affiliations
Huan-Bo Wang, Anhui Institute of Optics and Fine Mechanics (China)
Yu-jun Zhang, Anhui Institute of Optics and Fine Mechanics (China)
Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)
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