
Proceedings Paper
Design and characterization of a large-area integrating sphere uniform radiation source for calibration of satellite remote sensorsFormat | Member Price | Non-Member Price |
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Paper Abstract
The large field of view (FOV) imaging radiometers performed as remote sensors are extensively used
in remote sensing and surveillance applications. The pre-launch test and radiance calibration of large
FOV imaging remote sensors have resulted in the development of calibration techniques. One of these
calibration techniques is the employment of large-area integrating sphere radiation sources as radiance
transfer standards. To meet the calibration requirements of large FOV imaging remote sensors, a
large-area integrating sphere uniform radiation source (ISURS) based on a 1600 mm diameter
internally illuminated integrating sphere with a 620 mm diameter exit port is designed and
manufactured. This large-area integrating sphere radiation source has been used for pre-launch
calibration of large FOV imaging remote sensors which fly aboard Erath-observing satellites.
Paper Details
Date Published: 11 October 2010
PDF: 10 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76562E (11 October 2010); doi: 10.1117/12.863270
Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)
PDF: 10 pages
Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76562E (11 October 2010); doi: 10.1117/12.863270
Show Author Affiliations
Yingwei He, Beijing Institute of Technology (China)
Ping Li, National Institute of Metrology (China)
Published in SPIE Proceedings Vol. 7656:
5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Yudong Zhang; Jose M. Sasian; Libin Xiang; Sandy To, Editor(s)
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