
Proceedings Paper
Laser reflectometry near the critical angle for the analysis of chemical reactionsFormat | Member Price | Non-Member Price |
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Paper Abstract
In this work we describe an experimental technique to measure the kinetics of heterogeneous chemical reactions in
aqueous electrolytes, trough the continuous measurement of changes in the optical properties of the aqueous media using
laser reflectometry near the critical angle. Valuable information of the reaction rates that are taking place in the aqueous
side of an electrolyte-glass interface can be obtained if accurate relationships between changes in the reflectance,
refraction index, and content of chemical species are established. We report some of these relationships, the
experimental methodology, and the mathematical models needed to measure continuously chemical reaction rates, and
apply them for the leaching of metallic copper and the dissolution of cupric salts in acidic media. The results show that
laser reflectometry near the critical angle can be used as a suitable non-invasive accurate technique to measure in situ the
rate of dissolution reactions.
Paper Details
Date Published: 7 September 2010
PDF: 8 pages
Proc. SPIE 7799, Mathematics of Data/Image Coding, Compression, and Encryption with Applications XII, 77990R (7 September 2010); doi: 10.1117/12.862998
Published in SPIE Proceedings Vol. 7799:
Mathematics of Data/Image Coding, Compression, and Encryption with Applications XII
Mark S. Schmalz; Gerhard X. Ritter; Junior Barrera; Jaakko T. Astola, Editor(s)
PDF: 8 pages
Proc. SPIE 7799, Mathematics of Data/Image Coding, Compression, and Encryption with Applications XII, 77990R (7 September 2010); doi: 10.1117/12.862998
Show Author Affiliations
Tania Oyuki Chang-Martínez, Univ. Michoacana de San Nicolás de Hidalgo (Mexico)
Mary Carmen Peña-Gomar, Univ. Michoacana de San Nicolás de Hidalgo (Mexico)
Mary Carmen Peña-Gomar, Univ. Michoacana de San Nicolás de Hidalgo (Mexico)
Gonzalo Viramontes-Gamboa, Univ. Michoacana de San Nicolás de Hidalgo (Mexico)
Published in SPIE Proceedings Vol. 7799:
Mathematics of Data/Image Coding, Compression, and Encryption with Applications XII
Mark S. Schmalz; Gerhard X. Ritter; Junior Barrera; Jaakko T. Astola, Editor(s)
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