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Proceedings Paper

Silicon photomultiplier and radiation detection: follow-up study and the path forward
Author(s): Alon Osovizky; Dimitry Ginzburg; Natan S. Kopeika; Max Ghelman; Eliezer Marcus; Avi Manor; Vitaly Pushkarsky; Ilan Cohen-Zada; Ehud Gonen; Tzachi Mazor; Yagil Kadmon; Yossef Cohen
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Paper Abstract

This work presents a comprehensive study of the Silicon Photomultiplier (SiPM) properties as a novel alternative for radiation detector light sensor. The SiPM low current consumption, its diminutive dimensions and the high gain make this technology of great interest for applications in portable radiation detection instrumentation based on scintillation material. The development progress in investigation of the performance of the device incorporation with CsI(Tl) scintillation crystal during the R&D timeline is presented. The research shows the improvement in two major parameters: the noise level and the resolution. The finding emphasizes that the utilization of the SiPM as the light converting device in radiation sensors is potentially applicable for radiation detection and isotope identification.

Paper Details

Date Published: 3 September 2010
PDF: 5 pages
Proc. SPIE 7805, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XII, 78050D (3 September 2010); doi: 10.1117/12.862301
Show Author Affiliations
Alon Osovizky, Rotem Industries Ltd. (Israel)
Dimitry Ginzburg, Rotem Industries Ltd. (Israel)
Natan S. Kopeika, Ben-Gurion Univ. of the Negev (Israel)
Max Ghelman, Nuclear Research Ctr. Negev (Israel)
Eliezer Marcus, Nuclear Research Ctr. Negev (Israel)
Avi Manor, Rotem Industries Ltd. (Israel)
Vitaly Pushkarsky, Rotem Industries Ltd. (Israel)
Ilan Cohen-Zada, Rotem Industries Ltd. (Israel)
Ehud Gonen, Nuclear Research Ctr. Negev (Israel)
Tzachi Mazor, Nuclear Research Ctr. Negev (Israel)
Yagil Kadmon, Nuclear Research Ctr. Negev (Israel)
Yossef Cohen, Nuclear Research Ctr. Negev (Israel)

Published in SPIE Proceedings Vol. 7805:
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XII
Arnold Burger; Larry A. Franks; Ralph B. James, Editor(s)

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