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Proceedings Paper

Improved panchromatic sharpening
Author(s): Jonghwa Lee; Sangwook Lee; Chulhee Lee
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Paper Abstract

In this paper, we present a new panchromatic sharpening method based on quality parameter optimization. Traditionally, quality metrics such as UIQI, CORR, and ERGAS have been used to assess the quality of panchromatic sharpening. Generally, HPF (high pass filtering) based panchromatic sharpening methods produce good performance. However, one problem with these methods is the peak noise that arises due to a small denominator value when the mean shift problem is addressed. In order to address this problem, we introduce an offset value that was optimized based on a quality metric. We assumed that the offset value was invariant with respect to the spatial scale, and it was used to enhance the resolution of the original multispectral images by using a high-resolution panchromatic image. The experimental results demonstrate that the proposed method showed better performance than some existing panchromatic sharpening methods.

Paper Details

Date Published: 24 August 2010
PDF: 8 pages
Proc. SPIE 7810, Satellite Data Compression, Communications, and Processing VI, 78100T (24 August 2010); doi: 10.1117/12.862243
Show Author Affiliations
Jonghwa Lee, Yonsei Univ. (Korea, Republic of)
Sangwook Lee, Yonsei Univ. (Korea, Republic of)
Chulhee Lee, Yonsei Univ. (Korea, Republic of)

Published in SPIE Proceedings Vol. 7810:
Satellite Data Compression, Communications, and Processing VI
Bormin Huang; Antonio J. Plaza; Joan Serra-Sagristà; Chulhee Lee; Yunsong Li; Shen-En Qian, Editor(s)

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