The optical scattering signature and the absorbance of a material are of interest in a variety of engineering applications, particularly for those pertaining to optical remote sensing. The John Hopkins University Applied Physics Laboratory has developed an experimental capability to measure in-plane bidirectional scattering distribution functions to retrieve optical properties of materials. These measurements are supported at high angular resolution with wavelengths that span the ultra-violet to the long-wave infrared. Models have been developed to fit Lambertian, diffuse, near-specular, and specular scattering at a range of incident angles. Useful material properties can then be determined through analysis of the modeled BSDF. Optical characterization results are shown for a variety of materials, including paints, metals, optical windows, and leaves.

Date Published: 2 September 2010
PDF: 11 pages
Proc. SPIE 7792, Reflection, Scattering, and Diffraction from Surfaces II, 779211 (2 September 2010); doi: 10.1117/12.861499

Published in SPIE Proceedings Vol. 7792:
Reflection, Scattering, and Diffraction from Surfaces II
Zu-Han Gu; Leonard M. Hanssen, Editor(s)