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Proceedings Paper

Optical material characterization through BSDF measurement and analysis
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Paper Abstract

The optical scattering signature and the absorbance of a material are of interest in a variety of engineering applications, particularly for those pertaining to optical remote sensing. The John Hopkins University Applied Physics Laboratory has developed an experimental capability to measure in-plane bidirectional scattering distribution functions to retrieve optical properties of materials. These measurements are supported at high angular resolution with wavelengths that span the ultra-violet to the long-wave infrared. Models have been developed to fit Lambertian, diffuse, near-specular, and specular scattering at a range of incident angles. Useful material properties can then be determined through analysis of the modeled BSDF. Optical characterization results are shown for a variety of materials, including paints, metals, optical windows, and leaves.

Paper Details

Date Published: 2 September 2010
PDF: 11 pages
Proc. SPIE 7792, Reflection, Scattering, and Diffraction from Surfaces II, 779211 (2 September 2010); doi: 10.1117/12.861499
Show Author Affiliations
Andrea M. Brown, The Johns Hopkins Univ. (United States)
Daniel V. Hahn, The Johns Hopkins Univ. (United States)
Michael E. Thomas, The Johns Hopkins Univ. (United States)
David M. Brown, The Johns Hopkins Univ. (United States)
Jessica Makowski, The Johns Hopkins Univ. (United States)


Published in SPIE Proceedings Vol. 7792:
Reflection, Scattering, and Diffraction from Surfaces II
Zu-Han Gu; Leonard M. Hanssen, Editor(s)

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