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Proceedings Paper

Sensitivity of VIIRS polarization measurements
Author(s): Eugene Waluschka
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Paper Abstract

The design of an optical system typically involves a sensitivity analysis where the various lens parameters, such as lens spacing and curvatures, to name two parameters, are (slightly) varied to see what, if any, effect this has on the performance and to establish manufacturing tolerances. A similar analysis was performed for the VIIRS instruments polarization measurements to see how real world departures from perfectly linearly polarized light entering VIIRS effects the polarization measurement. The methodology and a few of the results of this polarization sensitivity analysis are presented and applied to the construction of a single polarizer which will cover the VIIRS VIS/NIR spectral range.

Paper Details

Date Published: 27 August 2010
PDF: 9 pages
Proc. SPIE 7807, Earth Observing Systems XV, 780704 (27 August 2010); doi: 10.1117/12.861433
Show Author Affiliations
Eugene Waluschka, NASA Goddard Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 7807:
Earth Observing Systems XV
James J. Butler; Xiaoxiong Xiong; Xingfa Gu, Editor(s)

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