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Proceedings Paper

Performance evaluation of a radial in-plane digital speckle pattern interferometer using a diffractive optical element for residual stress measurement
Author(s): A. Albertazzi Jr.; M. R. Viotti; W. A. Kapp
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Paper Abstract

A digital speckle pattern (DSP) interferometer using a special diffractive optical element (DOE) was developed by the authors. A collimated laser beam is diffracted by the DOE in such a way that the first diffraction orders produce a circular double illuminated measurement area. Due to natural symmetry of the illumination scheme, the interferometer reaches pure radial in-plane sensitivity. It is demonstrated and verified that the resulting interferometer is not sensitive to laser wavelength variations at all. Its configuration is presented as well as its performance evaluation for residual stress measurements using the blind hole-drilling method.

Paper Details

Date Published: 2 August 2010
PDF: 8 pages
Proc. SPIE 7791, Interferometry XV: Applications, 77910G (2 August 2010); doi: 10.1117/12.861153
Show Author Affiliations
A. Albertazzi Jr., Univ. Federal de Santa Catarina (Brazil)
M. R. Viotti, Univ. Federal de Santa Catarina (Brazil)
W. A. Kapp, Univ. Federal de Santa Catarina (Brazil)

Published in SPIE Proceedings Vol. 7791:
Interferometry XV: Applications
Cosme Furlong; Christophe Gorecki; Erik L. Novak, Editor(s)

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