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Proceedings Paper

Advanced static speckle calibration for exoplanet imaging
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Paper Abstract

In this communication we address the problem of post coronagraphic wavefront reconstruction. In high contrast imaging applications it is crucial to estimate the wavefront after the coronagraph, as close as possible to the science camera, in order to minimize non-common path errors. However closing the loop on such a measurement is a difficult exercise since several low order modes have been cancelled by the coronagraphs, thus leading to ill-posed inversion problems. Moreover sensing at the science detector is an intrusive method that disrupts the course of the observations. The Gemini Planet Imager (GPI) calibration system, based on a post-coronagraphic interferometer, provides an estimate of mid to high spatial frequencies aberrations that alleviates these two issues. However such a measurement have an intrinsic limitations that is related to the differential path errors between the two arm of the interferometer. In this paper we show how to devise wavefront reconstruction algorithms that account for these differential path errors. We identify two regimes, relative and absolute wavefront sensing, that depend on the magnitudes of the aberrations and the design of the coronagraph. We illustrate the performances for each regime. Finally we present experimental results obtained during the validation phase of show the results on laboratory data.

Paper Details

Date Published: 28 July 2010
PDF: 15 pages
Proc. SPIE 7736, Adaptive Optics Systems II, 77362A (28 July 2010); doi: 10.1117/12.858270
Show Author Affiliations
Laurent Pueyo, Jet Propulsion Lab. (United States)
Kent Wallace, Jet Propulsion Lab. (United States)
Mitchell Troy, Jet Propulsion Lab. (United States)
Rick Burruss, Jet Propulsion Lab. (United States)
Bruce Macintosh, Lawrence Livermore National Lab. (United States)
Remi Soummer, Space Telescope Science Institute (United States)

Published in SPIE Proceedings Vol. 7736:
Adaptive Optics Systems II
Brent L. Ellerbroek; Michael Hart; Norbert Hubin; Peter L. Wizinowich, Editor(s)

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