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Proceedings Paper

Improving the ruggedness of silicon pore optics
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Paper Abstract

In this paper we present the latest developments on the ruggedisation of the Silicon Pore Optics (SPO) mirror modules. SPO is one of the candidate technologies for producing the X-ray optics for the future space based Xray telescope, the International X-ray Observatory (IXO). To produce SPO mirror modules, Si mirrors are first bonded together using direct Si bonding to form a stack. These stacks are the glued into brackets, which then connect to the supporting optical bench by invar pins. The combination of brackets and invar pins now forms a full isostatic mount, and is rugged enough to allow the mirror module to survive the high loads of a launch. The mounting system furthermore allows for a certain level of manufacturing tolerances for the support structure, and ensures interchangeability of the mirror modules within one single ring of the optical bench. To prove this, a test interface has been designed and manufactured, on which a single, full fledged mirror module will be mounted to be exposed to environmental tests.

Paper Details

Date Published: 30 July 2010
PDF: 8 pages
Proc. SPIE 7732, Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray, 77322T (30 July 2010); doi: 10.1117/12.858121
Show Author Affiliations
Marcelo D. Ackermann, cosine Research B.V. (Netherlands)
Maximilien J. Collon, cosine Research B.V. (Netherlands)
Ramses Günther, cosine Research B.V. (Netherlands)
Rakesh Partapsing, cosine Research B.V. (Netherlands)
Marcos Bavdaz, European Space Research and Technology Ctr. (Netherlands)
Kotska Wallace, European Space Research and Technology Ctr. (Netherlands)
Eric Wille, European Space Research and Technology Ctr. (Netherlands)
Coen van Baren, SRON Netherlands Institute for Space Research (Netherlands)
Dirk Kampf, Kayser-Threde GmbH (Germany)
Markus Erhard, Kayser-Threde GmbH (Germany)

Published in SPIE Proceedings Vol. 7732:
Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray
Monique Arnaud; Stephen S. Murray; Tadayuki Takahashi, Editor(s)

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