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Proceedings Paper

Influence of fabrication accuracies of metal-dielectric layered flat lenses on their imaging properties
Author(s): Tomasz Stefaniuk; Rafal Kotynski; Grzegorz Nowak; Tomasz Szoplik
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Paper Abstract

We report on simulations of the imaging properties of metal-dielectric layered flat lenses and their tolerance to experimental inaccuracies of layers thickness and errors of permittivity values of materials. The multilayer structure consisting of silver and amorphous TiO2 is optimised in terms of the transmission efficiency and FWHM of the point spread function. Standard deviation of thickness for both metals and dielectrics layers, accepted in simulations, are twice bigger than actual fabrication parameters determined with quartz crystal microbalance. The errors of material permittivity measurements are taken from literature. Numerical investigation of imaging properties of the lenses is performed with the transfer matrix method. The quality of surfaces of silica substrate, titanium oxide, gold, and silver layers is measured with atomic force microscope.

Paper Details

Date Published: 29 April 2010
PDF: 7 pages
Proc. SPIE 7711, Metamaterials V, 77110G (29 April 2010); doi: 10.1117/12.858004
Show Author Affiliations
Tomasz Stefaniuk, Univ. of Warsaw (Poland)
Rafal Kotynski, Univ. of Warsaw (Poland)
Grzegorz Nowak, Institute of High Pressure Physics (Poland)
Tomasz Szoplik, Univ. of Warsaw (Poland)

Published in SPIE Proceedings Vol. 7711:
Metamaterials V
Nigel P. Johnson; Ekmel Özbay; Richard W. Ziolkowski; Nikolay I. Zheludev, Editor(s)

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