Share Email Print
cover

Proceedings Paper

Characterization and absolute QE measurements of delta-doped N-channel and P-channel CCDs
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In this paper we present the methodology for making absolute quantum efficiency (QE) measurements from the vacuum ultraviolet (VUV) through the near infrared (NIR) on delta-doped silicon CCDs. Delta-doped detectors provide an excellent platform to validate measurements through the VUV due to their enhanced UV response. The requirements for measuring QE through the VUV are more strenuous than measurements in the near UV and necessitate, among other things, the use of a vacuum monochromator, and good camera vacuum to prevent chip condensation, and more stringent handling requirements. The system used for these measurements was originally designed for deep UV characterization of CCDs for the WF/PC instrument on Hubble and later for Cassini CCDs.

Paper Details

Date Published: 13 July 2010
PDF: 12 pages
Proc. SPIE 7742, High Energy, Optical, and Infrared Detectors for Astronomy IV, 77420I (13 July 2010); doi: 10.1117/12.857694
Show Author Affiliations
Blake C. Jacquot, Jet Propulsion Lab. (United States)
Steve P. Monacos, Jet Propulsion Lab. (United States)
Todd J. Jones, Jet Propulsion Lab. (United States)
Jordana Blacksberg, Jet Propulsion Lab. (United States)
Michael E. Hoenk, Jet Propulsion Lab. (United States)
Shouleh Nikzad, Jet Propulsion Lab. (United States)


Published in SPIE Proceedings Vol. 7742:
High Energy, Optical, and Infrared Detectors for Astronomy IV
Andrew D. Holland; David A. Dorn, Editor(s)

© SPIE. Terms of Use
Back to Top