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Proceedings Paper

EPOL: the exoplanet polarimeter for EPICS at the E-ELT
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Paper Abstract

EPOL is the imaging polarimeter part of EPICS (Exoplanet Imaging Camera and Spectrograph) for the 42-m E-ELT. It is based on sensitive imaging polarimetry to differentiate between linearly polarized light from exoplanets and unpolarized, scattered starlight and to characterize properties of exoplanet atmospheres and surfaces that cannot be determined from intensity observations alone. EPOL consists of a coronagraph and a dual-beam polarimeter with a liquid-crystal retarder to exchange the polarization of the two beams. The polarimetry thereby increases the contrast between star and exoplanet by 3 to 5 orders of magnitude over what the extreme adaptive optics and the EPOL coronagraph alone can achieve. EPOL operates between 600 and 900 nm, can select more specific wavelength bands with filters and aims at having an integral field unit to obtain linearly polarized spectra of known exoplanets. We present the conceptual design of EPOL along with an analysis of its performance.

Paper Details

Date Published: 20 July 2010
PDF: 13 pages
Proc. SPIE 7735, Ground-based and Airborne Instrumentation for Astronomy III, 77356G (20 July 2010); doi: 10.1117/12.857626
Show Author Affiliations
Christoph U. Keller, Utrecht Univ. (Netherlands)
Hans Martin Schmid, ETH Zürich (Switzerland)
Lars B. Venema, NOVA-ASTRON (Netherlands)
Hiddo Hanenburg, NOVA-ASTRON (Netherlands)
Rieks Jager, NOVA-SRON (Netherlands)
Markus Kasper, European Southern Observatory (Germany)
Patrice Martinez, European Southern Observatory (Germany)
Florence Rigal, NOVA-ASTRON (Netherlands)
Michiel Rodenhuis, Utrecht Univ. (Netherlands)
Ronald Roelfsema, NOVA-ASTRON (Netherlands)
Frans Snik, Utrecht Univ. (Netherlands)
Christophe Verinaud, Lab. d'Astrophysique de l'Observatoire de Grenoble (France)
Natalia Yaitskova, European Southern Observatory (Germany)

Published in SPIE Proceedings Vol. 7735:
Ground-based and Airborne Instrumentation for Astronomy III
Ian S. McLean; Suzanne K. Ramsay; Hideki Takami, Editor(s)

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