
Proceedings Paper
High-performance silicon grisms for 1.2-8.0 um: detailed results from the JWST-NIRCam devicesFormat | Member Price | Non-Member Price |
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Paper Abstract
We have recently completed a set of silicon grisms for JWST-NIRCam. These devices have exquisite optical
characteristics: phase surfaces flat to λ/100 peak to valley at the blaze wavlength, diffraction-limited PSFs down
to 10-5 of the peak, low scattered light levels, and large resolving-power slit-width products for their width and
thickness. The one possible drawback to these devices is the large Fresnel loss caused by the large refractive
index of Si. We report here on throughput and phase-surface measurements for a sample grating with a high
performance antireflection coating on both the flat and grooved surfaces. These results indicate that we can
achieve very high on-blaze efficiencies. The high throughput should make Si grisms an attractive dispersive
element for moderate resolution IR spectroscopy in both ground and space based instruments throughout the
1.2-8 μm spectral region.
Paper Details
Date Published: 20 July 2010
PDF: 7 pages
Proc. SPIE 7739, Modern Technologies in Space- and Ground-based Telescopes and Instrumentation, 77393S (20 July 2010); doi: 10.1117/12.857568
Published in SPIE Proceedings Vol. 7739:
Modern Technologies in Space- and Ground-based Telescopes and Instrumentation
Eli Atad-Ettedgui; Dietrich Lemke, Editor(s)
PDF: 7 pages
Proc. SPIE 7739, Modern Technologies in Space- and Ground-based Telescopes and Instrumentation, 77393S (20 July 2010); doi: 10.1117/12.857568
Show Author Affiliations
M. Gully-Santiago, The Univ. of Texas at Austin (United States)
W. Wang, The Univ. of Texas at Austin (United States)
C. Deen, The Univ. of Texas at Austin (United States)
D. Kelly, The Univ. of Arizona (United States)
W. Wang, The Univ. of Texas at Austin (United States)
C. Deen, The Univ. of Texas at Austin (United States)
D. Kelly, The Univ. of Arizona (United States)
T. P. Greene, NASA Ames Research Ctr. (United States)
J. Bacon, II-VI Inc. (United States)
D. T. Jaffe, The Univ. of Texas at Austin (United States)
J. Bacon, II-VI Inc. (United States)
D. T. Jaffe, The Univ. of Texas at Austin (United States)
Published in SPIE Proceedings Vol. 7739:
Modern Technologies in Space- and Ground-based Telescopes and Instrumentation
Eli Atad-Ettedgui; Dietrich Lemke, Editor(s)
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