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Proceedings Paper

The 2010 interferometric imaging beauty contest
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Paper Abstract

We present the results of the fourth Optical/IR Interferometry Imaging Beauty Contest. The contest consists of blind imaging of test data sets derived from model sources and distributed in the OI-FITS format. The test data consists of spectral data sets on an object "observed" in the infrared with spectral resolution. There were 4 different algorithms competing this time: BSMEM the Bispectrum Maximum Entropy Method by Young, Baron & Buscher; RPR the Recursive Phase Reconstruction by Rengaswamy; SQUEEZE a Markov Chain Monte Carlo algorithm by Baron, Monnier & Kloppenborg; and, WISARD theWeak-phase Interferometric Sample Alternating Reconstruction Device by Vannier & Mugnier. The contest model image, the data delivered to the contestants and the rules are described as well as the results of the image reconstruction obtained by each method. These results are discussed as well as the strengths and limitations of each algorithm.

Paper Details

Date Published: 2 August 2010
PDF: 12 pages
Proc. SPIE 7734, Optical and Infrared Interferometry II, 77342N (2 August 2010); doi: 10.1117/12.857066
Show Author Affiliations
Fabien Malbet, Lab. d'Astrophysique de Grenoble, Univ. J. Fourier, CNRS (France)
Jean-Marie Mariotti Ctr. (France)
William Cotton, National Radio Astronomy Observatory (United States)
Gilles Duvert, Lab. d'Astrophysique de Grenoble, Univ. J. Fourier, CNRS (France)
Jean-Marie Mariotti Ctr. (France)
Peter Lawson, Jet Propulsion Lab. (United States)
Andrea Chiavassa, Max-Planck-Institut für Astrophysik (Germany)
John Young, Cavendish Lab. (United Kingdom)
Fabien Baron, Univ. of Michigan (United States)
David Buscher, Cavendish Lab. (United Kingdom)
Sridharan Rengaswamy, European Southern Observatory (Germany)
Brian Kloppenborg, Univ. of Denver (United States)
Martin Vannier, Lab. H. Fizeau, Univ. de Nice-Sophia Antipolis (France)
Laurent Mugnier, ONERA, DOTA (France)

Published in SPIE Proceedings Vol. 7734:
Optical and Infrared Interferometry II
William C. Danchi; Françoise Delplancke; Jayadev K. Rajagopal, Editor(s)

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