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Proceedings Paper

Mid-infrared astronomy with the E-ELT: performance of METIS
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Paper Abstract

We present results of performance modelling for METIS, the Mid-infrared European Extremely Large Telescope Imager and Spectrograph. Designed by a consortium of NOVA (Netherlands), UK Astronomy Technology Centre (UK), MPIA Heidelberg (Germany), CEA Saclay (France) and KU Leuven (Belgium), METIS will cover the atmospheric windows in L, M and N-band and will offer imaging, medium-resolution slit spectroscopy (R~1000- 3000) and high-resolution integral field spectroscopy (R~100,000). Our model uses a detailed set of input parameters for site characteristics and atmospheric profiles, optical design, thermal background and the most up-to-date IR detector specifications. We show that METIS will bring an orders-of-magnitude level improvement in sensitivity and resolution over current ground-based IR facilities, bringing mid-IR sensitivities to the micro- Jansky regime. As the only proposed E-ELT instrument to cover this entire spectral region, and the only mid-IR high-resolution integral field unit planned on the ground or in space, METIS will open up a huge discovery space in IR astronomy in the next decade.

Paper Details

Date Published: 20 July 2010
PDF: 13 pages
Proc. SPIE 7735, Ground-based and Airborne Instrumentation for Astronomy III, 77355F (20 July 2010); doi: 10.1117/12.857043
Show Author Affiliations
S. Kendrew, Leiden Observatory, Leiden Univ. (Netherlands)
L. Jolissaint, Leiden Observatory, Leiden Univ. (Netherlands)
B. Brandl, Leiden Observatory, Leiden Univ. (Netherlands)
R. Lenzen, Max Planck Institute for Astronomy (Germany)
E. Pantin, CEA Saclay (France)
A. Glasse, UK Astronomy Technology Ctr., The Royal Observatory of Edinburgh (United Kingdom)
J. Blommaert, Katholieke Univ. Leuven (Belgium)
L. Venema, ASTRON (Netherlands)
R. Siebenmorgen, European Southern Observatory (Germany)
F. Molster, NOVA (Netherlands)

Published in SPIE Proceedings Vol. 7735:
Ground-based and Airborne Instrumentation for Astronomy III
Ian S. McLean; Suzanne K. Ramsay; Hideki Takami, Editor(s)

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