
Proceedings Paper
Analysis of the spectral symmetry in wavelength-tuning interferometry using an external cavity laser diodeFormat | Member Price | Non-Member Price |
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Paper Abstract
Performances of scanning wavelength systems are limited by several factors like the
sweeping range, the mode-hop-free tuning of the wavelength and the nonlinearities in the
sweeping speed. Nonlinearities are probably the last parameter to control to get the least
performances. In our absolute distance interferometer (ADI), we have observed that the
processing technique of the fringes in case of a double target system is very sensitive to
the type of nonlinearities and the final resolution of the ADI depends strongly on their
shape. Although the ideal sweeping speed should be perfectly linear, we have observed
that even in the presence of strong sinusoidal nonlinearities in the sweeping speed,
unexpected good results were obtained and were explained by the fact that these
nonlinearities act like some white noise whose contribution converges to zero as the
number of samples of the processed signal increases. In this paper we focus on the
symmetry of the spectrum, another consequence of these nonlinearities. We show how it
is possible to manipulate the spectrum by changing the sweeping speed. Results of
simulations as well as experimental measurements are presented.
Paper Details
Date Published: 27 April 2010
PDF: 12 pages
Proc. SPIE 7720, Semiconductor Lasers and Laser Dynamics IV, 77202B (27 April 2010); doi: 10.1117/12.854886
Published in SPIE Proceedings Vol. 7720:
Semiconductor Lasers and Laser Dynamics IV
Krassimir Panajotov; Marc Sciamanna; Angel A. Valle; Rainer Michalzik, Editor(s)
PDF: 12 pages
Proc. SPIE 7720, Semiconductor Lasers and Laser Dynamics IV, 77202B (27 April 2010); doi: 10.1117/12.854886
Show Author Affiliations
Luc Perret, Univ. de Strasbourg (France)
Pierre Pfeiffer, Univ. de Strasbourg (France)
Published in SPIE Proceedings Vol. 7720:
Semiconductor Lasers and Laser Dynamics IV
Krassimir Panajotov; Marc Sciamanna; Angel A. Valle; Rainer Michalzik, Editor(s)
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