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Proceedings Paper

Optical tomography based on phase-shifting schlieren deflectometry
Author(s): Emmanuel Foumouo; Jean-Luc Dewandel; Luc Joannes; Didier Beghuin; Laurent Jacques; Philippe Antoine
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Paper Abstract

We present a new optical tomography technique based on phase-shifting schlieren deflectometry. The principle is that of computerized tomography. The three-dimensional profile is reconstructed from the deflection angles of rays passing through the tested object. We have investigated optical phantoms chosen in view of the characterization of dendritic growth in a solidification process. Promising results have been obtained with a homogeneous sphere and a bundle of 200μm fibers. The deviation angles exceed two degrees with a variation of the refractive index ▵n=0.025.

Paper Details

Date Published: 13 May 2010
PDF: 8 pages
Proc. SPIE 7726, Optical Sensing and Detection, 77260U (13 May 2010);
Show Author Affiliations
Emmanuel Foumouo, Univ. Catholique de Louvain (Belgium)
Jean-Luc Dewandel, Lambda-X s.a. (Belgium)
Luc Joannes, Lambda-X s.a. (Belgium)
Didier Beghuin, Lambda-X s.a. (Belgium)
Laurent Jacques, Univ. Catholique de Louvain (Belgium)
Philippe Antoine, Univ. Catholique de Louvain (Belgium)

Published in SPIE Proceedings Vol. 7726:
Optical Sensing and Detection
Francis Berghmans; Anna Grazia Mignani; Chris A. van Hoof, Editor(s)

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