
Proceedings Paper
Scalar product technique in modal decomposition for multimode fibersFormat | Member Price | Non-Member Price |
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Paper Abstract
Both theoretical and experimental analysis of a new efficient method to measure the number and type of modes
propagating in optical fibers are presented. This consists in measuring the intensity of the near field image at the end of a
fiber while scanning the wavelength with a laser source signal. Modes are extracted from Fourier transformation of the
spectral data at each point (x,y) of the images. A novel technique which is referred to as scalar product technique is
implemented in order to reconfirm real modes and exclude spurious modes. The technique is based on the orthogonality
of different modes. A standard multimode fiber has been measured to verify the technique. Three real modes LP01, LP11, and LP02 are discovered and reconfirmed by the orthogonality with the minimum values of the scalar products. One
spurious mode, which comes from the dependence of the power of the laser source on the wavelength, is thus excluded as it is not orthogonal either to the LP11 mode or the LP02 mode.
Paper Details
Date Published: 14 May 2010
PDF: 10 pages
Proc. SPIE 7717, Optical Modelling and Design, 77170V (14 May 2010); doi: 10.1117/12.853673
Published in SPIE Proceedings Vol. 7717:
Optical Modelling and Design
Frank Wyrowski; John T. Sheridan; Jani Tervo; Youri Meuret, Editor(s)
PDF: 10 pages
Proc. SPIE 7717, Optical Modelling and Design, 77170V (14 May 2010); doi: 10.1117/12.853673
Show Author Affiliations
D. M. Nguyen, Univ. Européenne de Bretagne, Lab. Foton, CNRS (France)
CCLO-FOTON, ENSSAT (France)
T. N. Nguyen, Posts and Telecommunications Institute of Technology (Viet Nam)
S. Blin, Institut d'Électronique du Sud, CNRS, Univ. de Montpellier II (France)
CCLO-FOTON, ENSSAT (France)
T. N. Nguyen, Posts and Telecommunications Institute of Technology (Viet Nam)
S. Blin, Institut d'Électronique du Sud, CNRS, Univ. de Montpellier II (France)
M. Thual, Univ. Européenne de Bretagne, Lab. Foton, CNRS (France)
CCLO-FOTON, ENSSAT (France)
T. Chartier, Univ. Européenne de Bretagne, Lab. Foton, CNRS (France)
CCLO-FOTON, ENSSAT (France)
T. Chartier, Univ. Européenne de Bretagne, Lab. Foton, CNRS (France)
Published in SPIE Proceedings Vol. 7717:
Optical Modelling and Design
Frank Wyrowski; John T. Sheridan; Jani Tervo; Youri Meuret, Editor(s)
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