Proceedings Paper
A 350-GHz high-resolution high-sensitivity passive video imaging system| Format | Member Price | Non-Member Price |
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Paper Abstract
We are developing a 350 GHz cryogenic passive video imaging system. This demonstration system uses 800
photon-noise-limited superconducting transition edge sensor bolometers. It will image a 1 m x 1 m area at a
standoff distance of 16 m to a resolution of approximately 1 cm at video frame rates (20 frames per second).
High spatial resolution is achieved by the use of an f/2.0 Cassegrain optical system with 1.3 m primary mirror.
Preliminary testing of prototype detectors indicates that we can achieve a noise equivalent temperature difference
(NETD) of 70 mK for the fully sampled 1 m × 1 m image at 20 frames per second.
Paper Details
Date Published: 27 April 2010
PDF: 7 pages
Proc. SPIE 7670, Passive Millimeter-Wave Imaging Technology XIII, 76700M (27 April 2010); doi: 10.1117/12.852932
Published in SPIE Proceedings Vol. 7670:
Passive Millimeter-Wave Imaging Technology XIII
David A. Wikner; Arttu R. Luukanen, Editor(s)
PDF: 7 pages
Proc. SPIE 7670, Passive Millimeter-Wave Imaging Technology XIII, 76700M (27 April 2010); doi: 10.1117/12.852932
Show Author Affiliations
Daniel Becker, National Institute of Standards and Technology (United States)
James Beall, National Institute of Standards and Technology (United States)
Hsiao-Mei Cho, National Institute of Standards and Technology (United States)
William Duncan, National Institute of Standards and Technology (United States)
Gene Hilton, National Institute of Standards and Technology (United States)
Rob Horansky, National Institute of Standards and Technology (United States)
Kent Irwin, National Institute of Standards and Technology (United States)
Peter Lowell, National Institute of Standards and Technology (United States)
Michael Niemack, National Institute of Standards and Technology (United States)
James Beall, National Institute of Standards and Technology (United States)
Hsiao-Mei Cho, National Institute of Standards and Technology (United States)
William Duncan, National Institute of Standards and Technology (United States)
Gene Hilton, National Institute of Standards and Technology (United States)
Rob Horansky, National Institute of Standards and Technology (United States)
Kent Irwin, National Institute of Standards and Technology (United States)
Peter Lowell, National Institute of Standards and Technology (United States)
Michael Niemack, National Institute of Standards and Technology (United States)
Nick Paulter, National Institute of Standards and Technology (United States)
Carl Reintsema, National Institute of Standards and Technology (United States)
Frank Schima, National Institute of Standards and Technology (United States)
Robert Schwall, National Institute of Standards and Technology (United States)
Ki Won Yoon, National Institute of Standards and Technology (United States)
Peter Ade, Cardiff Univ. (United Kingdom)
Carole Tucker, Cardiff Univ. (United Kingdom)
Simon Dicker, Univ. of Pennsylvania (United States)
Mark Halpern, The Univ. of British Columbia (Canada)
Carl Reintsema, National Institute of Standards and Technology (United States)
Frank Schima, National Institute of Standards and Technology (United States)
Robert Schwall, National Institute of Standards and Technology (United States)
Ki Won Yoon, National Institute of Standards and Technology (United States)
Peter Ade, Cardiff Univ. (United Kingdom)
Carole Tucker, Cardiff Univ. (United Kingdom)
Simon Dicker, Univ. of Pennsylvania (United States)
Mark Halpern, The Univ. of British Columbia (Canada)
Published in SPIE Proceedings Vol. 7670:
Passive Millimeter-Wave Imaging Technology XIII
David A. Wikner; Arttu R. Luukanen, Editor(s)
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