
Proceedings Paper
Effect of periodic roughness and surface defects on the terahertz scattering behavior of cylindrical objectsFormat | Member Price | Non-Member Price |
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Paper Abstract
This paper discusses the effect of periodic roughness and surface defects on the electromagnetic scattering of
terahertz waves from cylindrical objects. The cylinders, possessing periodic roughness imparted during their fabrication
process, had average roughness values ranging from approximately 0.1 μm - 0.50 μm. Metallic cylinders were
fabricated from lathe-turned aluminum rods and dielectric cylinders were fabricated using a rapid prototype technique
(stereolithography). The scattering behavior of the rough cylinders was measured in 160 GHz and 350 GHz compact
radar ranges. In addition, the effect of seams and grooves on the scattering behavior of cylinders will also be presented.
Paper Details
Date Published: 26 April 2010
PDF: 12 pages
Proc. SPIE 7671, Terahertz Physics, Devices, and Systems IV: Advanced Applications in Industry and Defense, 76710E (26 April 2010); doi: 10.1117/12.852909
Published in SPIE Proceedings Vol. 7671:
Terahertz Physics, Devices, and Systems IV: Advanced Applications in Industry and Defense
Mehdi Anwar; Nibir K. Dhar; Thomas W. Crowe, Editor(s)
PDF: 12 pages
Proc. SPIE 7671, Terahertz Physics, Devices, and Systems IV: Advanced Applications in Industry and Defense, 76710E (26 April 2010); doi: 10.1117/12.852909
Show Author Affiliations
A. Jagannathan, Univ. of Massachusetts Lowell (United States)
A. J. Gatesman, Univ. of Massachusetts Lowell (United States)
T. Horgan, Univ. of Massachusetts Lowell (United States)
T. Goyette, Univ. of Massachusetts Lowell (United States)
A. J. Gatesman, Univ. of Massachusetts Lowell (United States)
T. Horgan, Univ. of Massachusetts Lowell (United States)
T. Goyette, Univ. of Massachusetts Lowell (United States)
M. Coulombe, Univ. of Massachusetts Lowell (United States)
R. H. Giles, Univ. of Massachusetts Lowell (United States)
W. E. Nixon, U.S. Army National Ground Intelligence Ctr. (United States)
R. H. Giles, Univ. of Massachusetts Lowell (United States)
W. E. Nixon, U.S. Army National Ground Intelligence Ctr. (United States)
Published in SPIE Proceedings Vol. 7671:
Terahertz Physics, Devices, and Systems IV: Advanced Applications in Industry and Defense
Mehdi Anwar; Nibir K. Dhar; Thomas W. Crowe, Editor(s)
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