
Proceedings Paper
Functional diffuse reflectance spectroscopy at small source-detector distances based on fast-gated single-photon avalanche diodesFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
In this review we present the instrumental and theoretical developments for functional diffuse reflectance spectroscopy at
small source-detector distances. We proposed the possibility to perform photon migration measurements at null or small
inter-fiber distances demonstrating the improvement of this novel approach in terms of achievable contrast, spatial
resolution and number of detected photons. We developed a novel system to perform time-resolved diffuse reflectance
measurement at small source detector separation based on a single photon avalanche photodiode (SPAD) operated in fast
time gated mode and a broadband fiber laser. By means of time gating it is possible to detect longer lived photons
neglecting initial ones. We show results both on homogeneous and inhomogeneous tissue phantoms demonstrating a
dynamic range of 7 orders of magnitude and a temporal range of 6 nanoseconds. Furthermore, this approach proved
valuable to detect brain activity.
Paper Details
Date Published: 29 April 2010
PDF: 8 pages
Proc. SPIE 7681, Advanced Photon Counting Techniques IV, 768102 (29 April 2010); doi: 10.1117/12.852557
Published in SPIE Proceedings Vol. 7681:
Advanced Photon Counting Techniques IV
Mark A. Itzler; Joe C. Campbell, Editor(s)
PDF: 8 pages
Proc. SPIE 7681, Advanced Photon Counting Techniques IV, 768102 (29 April 2010); doi: 10.1117/12.852557
Show Author Affiliations
Davide Contini, Politecnico di Milano (Italy)
Antonio Pifferi, Politecnico di Milano (Italy)
Lorenzo Spinelli, Istituto di Fotonica e Nanotecnologie (Italy)
Alessandro Torricelli, Politecnico di Milano (Italy)
Rinaldo Cubeddu, Politecnico di Milano (Italy)
Istituto di Fotonica e Nanotecnologie (Italy)
ULTRAS-INFM-CNR (Italy)
Fabrizio Martelli, Univ. degli Studi di Firenze (Italy)
Antonio Pifferi, Politecnico di Milano (Italy)
Lorenzo Spinelli, Istituto di Fotonica e Nanotecnologie (Italy)
Alessandro Torricelli, Politecnico di Milano (Italy)
Rinaldo Cubeddu, Politecnico di Milano (Italy)
Istituto di Fotonica e Nanotecnologie (Italy)
ULTRAS-INFM-CNR (Italy)
Fabrizio Martelli, Univ. degli Studi di Firenze (Italy)
Giovanni Zaccanti, Univ. degli Studi di Firenze (Italy)
Alberto Dalla Mora, Politecnico di Milano (Italy)
Alberto Tosi, Politecnico di Milano (Italy)
Franco Zappa, Politecnico di Milano (Italy)
Micro Photon Devices (Italy)
Sergio Cova, Politecnico di Milano (Italy)
Micro Photon Devices (Italy)
Alberto Dalla Mora, Politecnico di Milano (Italy)
Alberto Tosi, Politecnico di Milano (Italy)
Franco Zappa, Politecnico di Milano (Italy)
Micro Photon Devices (Italy)
Sergio Cova, Politecnico di Milano (Italy)
Micro Photon Devices (Italy)
Published in SPIE Proceedings Vol. 7681:
Advanced Photon Counting Techniques IV
Mark A. Itzler; Joe C. Campbell, Editor(s)
© SPIE. Terms of Use
