Share Email Print

Proceedings Paper

Effect of error in crack tip identification on the photoelastic evaluation of SIFs of interface cracks
Author(s): B. Neethi Simon; K Ramesh
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Digital photoelastic evaluation of stress intensity factors (SIFs) of bimaterial interface cracks using the method of least squares and the multi-parameter stress field equations is of current interest. For this, positional coordinates (with crack tip as origin) and corresponding fringe orders of data points are collected along isochromatic fringe contours in such a way that the geometric features of the fringe field are captured. Whole-field evaluation of isochromatic parameter is now made possible by various techniques of digital photoelasticity, enabling automation of the data collection procedure and collection of data points along fractional fringe orders as well. However, the identification of the crack tip, still done interactively, is prone to error. When the crack tip location is inaccurately identified, the evaluated SIFs are considerably different. The effect of error in precise identification of the crack tip on the evaluated SIFs is analyzed with the help of theoretically simulated fringe fields, in order to arrive at a technique by which the crack tip could be detected in a semiautomated fashion reducing this error in the evaluated SIFs.

Paper Details

Date Published: 14 April 2010
PDF: 8 pages
Proc. SPIE 7522, Fourth International Conference on Experimental Mechanics, 75220D (14 April 2010); doi: 10.1117/12.852519
Show Author Affiliations
B. Neethi Simon, Indian Institute of Technology Madras (India)
K Ramesh, Indian Institute of Technology Madras (India)

Published in SPIE Proceedings Vol. 7522:
Fourth International Conference on Experimental Mechanics
Chenggen Quan; Kemao Qian; Anand Krishna Asundi; Fook Siong Chau, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?