
Proceedings Paper
Photonic crystal scene projector developmentFormat | Member Price | Non-Member Price |
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Paper Abstract
This paper describes results from the Extremely High Temperature Photonic Crystal System
Technology (XTEMPS) program. The XTEMPS program is developing projector technology
based on photonic crystals capable of high dynamic range, multispectral emission from SWIR to
LWIR, and realistic band widths. These Photonics Crystals (PhC) are fabricated from refractory
materials to provide high radiance and long device lifetime. Cyan is teamed with Sandia
National Laboratories, to develop photonics crystals designed for realistic scene projection
systems and Nova sensors to utilize their advanced Read In Integrated Circuit (RIIC). PhC based
emitters show improved in-band output power efficiency when compared to broad band
"graybody" emitters due to the absence of out-of-band emission. Less electrical power is
required to achieve high operating temperature, and the potential for nonequilibrium pumping
exists. Both effects boost effective radiance output. Cyan has demonstrated pixel designs
compatible with Nova's medium format RIIC, ensuring high apparent output temperatures,
modest drive currents, and low operating voltages of less than five volts. Unit cell pixel
structures with high radiative efficiency have been demonstrated, and arrays using PhC
optimized for up to four spectral bands have been successfully patterned.
Paper Details
Date Published: 23 April 2010
PDF: 10 pages
Proc. SPIE 7663, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV, 766309 (23 April 2010); doi: 10.1117/12.852388
Published in SPIE Proceedings Vol. 7663:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV
James A. Buford Jr.; Robert Lee Murrer Jr., Editor(s)
PDF: 10 pages
Proc. SPIE 7663, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV, 766309 (23 April 2010); doi: 10.1117/12.852388
Show Author Affiliations
J. A. Wilson, Cyan Systems (United States)
B. Burckel, Sandia National Labs. (United States)
J. Caulfield, Cyan Systems (United States)
S. Cogan, Nova Sensors (United States)
B. Burckel, Sandia National Labs. (United States)
J. Caulfield, Cyan Systems (United States)
S. Cogan, Nova Sensors (United States)
Published in SPIE Proceedings Vol. 7663:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV
James A. Buford Jr.; Robert Lee Murrer Jr., Editor(s)
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