
Proceedings Paper
Component-level testing updates for the infrared polarized scene-generator demonstratorFormat | Member Price | Non-Member Price |
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Paper Abstract
Polarization signature information is becoming more useful as an added classifier in a variety of signature analysis
applications. However, there are few infrared (IR) scene
projection systems that provide the capability to inject target
simulation images with polarization content into a seeker, or
other imaging sensor. In a previous paper1 we discussed
experimental results for an infrared (IR) polarized scene
generator (PSG) concept demonstrator. The concept
demonstrator operated in ambient environmental conditions and
displayed polarized scenes of resolved targets. The IR PSG
demonstrator that is the goal of this research must be capable of
testing sensor systems operating in cryogenic-vacuum (cryo-vac
or CV) environments. The IR PSG must also be able to
accurately project scenes with unresolved polarized targets. As
part of the development process, several potential PSG
components are being tested in ambient and liquid nitrogen
(LN2) environments to verify functionality and changes in
behavior at ambient, vacuum, and cryovac conditions. This
paper presents test data for several of the components.
Components tested were an IR source, a polarizer, and motion
control components. We also present test data for an imaging
polarimeter being developed to validate the PSG.
Paper Details
Date Published: 23 April 2010
PDF: 12 pages
Proc. SPIE 7663, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV, 766307 (23 April 2010); doi: 10.1117/12.851910
Published in SPIE Proceedings Vol. 7663:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV
James A. Buford Jr.; Robert Lee Murrer Jr., Editor(s)
PDF: 12 pages
Proc. SPIE 7663, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV, 766307 (23 April 2010); doi: 10.1117/12.851910
Show Author Affiliations
Peter S. Erbach, Polaris Sensor Technologies, Inc. (United States)
J. Larry Pezzaniti, Polaris Sensor Technologies, Inc. (United States)
John Reinhardt, Polaris Sensor Technologies, Inc. (United States)
J. Larry Pezzaniti, Polaris Sensor Technologies, Inc. (United States)
John Reinhardt, Polaris Sensor Technologies, Inc. (United States)
David B. Chenault, Polaris Sensor Technologies, Inc. (United States)
Dennis H Goldstein, Polaris Sensor Technologies, Inc. (United States)
Heard S. Lowry, Aerospace Testing Alliance (United States)
Dennis H Goldstein, Polaris Sensor Technologies, Inc. (United States)
Heard S. Lowry, Aerospace Testing Alliance (United States)
Published in SPIE Proceedings Vol. 7663:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV
James A. Buford Jr.; Robert Lee Murrer Jr., Editor(s)
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