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Proceedings Paper

Component-level testing updates for the infrared polarized scene-generator demonstrator
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Paper Abstract

Polarization signature information is becoming more useful as an added classifier in a variety of signature analysis applications. However, there are few infrared (IR) scene projection systems that provide the capability to inject target simulation images with polarization content into a seeker, or other imaging sensor. In a previous paper1 we discussed experimental results for an infrared (IR) polarized scene generator (PSG) concept demonstrator. The concept demonstrator operated in ambient environmental conditions and displayed polarized scenes of resolved targets. The IR PSG demonstrator that is the goal of this research must be capable of testing sensor systems operating in cryogenic-vacuum (cryo-vac or CV) environments. The IR PSG must also be able to accurately project scenes with unresolved polarized targets. As part of the development process, several potential PSG components are being tested in ambient and liquid nitrogen (LN2) environments to verify functionality and changes in behavior at ambient, vacuum, and cryovac conditions. This paper presents test data for several of the components. Components tested were an IR source, a polarizer, and motion control components. We also present test data for an imaging polarimeter being developed to validate the PSG.

Paper Details

Date Published: 23 April 2010
PDF: 12 pages
Proc. SPIE 7663, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV, 766307 (23 April 2010); doi: 10.1117/12.851910
Show Author Affiliations
Peter S. Erbach, Polaris Sensor Technologies, Inc. (United States)
J. Larry Pezzaniti, Polaris Sensor Technologies, Inc. (United States)
John Reinhardt, Polaris Sensor Technologies, Inc. (United States)
David B. Chenault, Polaris Sensor Technologies, Inc. (United States)
Dennis H Goldstein, Polaris Sensor Technologies, Inc. (United States)
Heard S. Lowry, Aerospace Testing Alliance (United States)


Published in SPIE Proceedings Vol. 7663:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV
James A. Buford Jr.; Robert Lee Murrer Jr., Editor(s)

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