Share Email Print

Proceedings Paper

Thickness and roughness measurement using a reflective digital holographic microscope
Author(s): Majinyang Song; Constance Kang Ting Teoh; Ruojun Ding
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Digital Holography is a new technology that promises many applications in diverse areas. Using numerical reconstruction of digitally recorded hologram, the Reflection Digital Holographic Microscope (DHM) provides the intensity, phase images which give the 3D depth profile of micro-devices. These essential data provided by digital holography are very useful for new MEMS design and fabrication as well as thin film growth. Having advantages over other existing measurement methods, it can possibly serve as an easier alternative in future. In this study, we further investigate the accuracy and specifications of thickness measurement, topography and roughness analysis using the DHM. By comparing the DHM results with alpha-stepper (a form of stylus probing) and Atomic Force Microscope (AFM), we find that the accuracy of the DHM for thickness measurement and roughness analysis is about 10%. The thickness and roughness range is also found to be 50nm to 500nm. Our experimental study hence demonstrates that digital holography has the potential to be developed into a suitable tool for thickness measurement and roughness analysis due to it being non-invasive and being able to provide quick time and relatively accurate measurements.

Paper Details

Date Published: 14 April 2010
PDF: 9 pages
Proc. SPIE 7522, Fourth International Conference on Experimental Mechanics, 752267 (14 April 2010); doi: 10.1117/12.851469
Show Author Affiliations
Majinyang Song, Raffles Girls' School (Secondary) (Singapore)
Constance Kang Ting Teoh, Raffles Girls' School (Secondary) (Singapore)
Ruojun Ding, Raffles Girls' School (Secondary) (Singapore)

Published in SPIE Proceedings Vol. 7522:
Fourth International Conference on Experimental Mechanics
Chenggen Quan; Kemao Qian; Anand Krishna Asundi; Fook Siong Chau, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?