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Proceedings Paper

Integrated high resolution division of focal plane image sensor with aluminum nanowire polarization filters
Author(s): Viktor Gruev; Rob Perkins; Timothy York
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Paper Abstract

We present a novel imaging sensor capable of capturing the polarization properties of partially polarized light in high resolution and in real-time. The imaging sensor monolithically integrates aluminum nanowire optical filters with CCD imaging array to achieve a high resolution polarization imaging sensor. The CCD polarization image sensor is composed of 1000 by 1000 imaging elements with 7.4μm pixel pitch and has dynamic range of 65dB. The measured signal-to-noise ratio of the sensor is 45dB. The CCD array is covered with an array of pixel-pitch matched nanowire polarization filters with four different orientations offset by 45°. Raw polarization data is presented to a processing board at 40 frames per second, where intensity, degree and angle of polarization of the incident light are computed. The final polarization results are presented in false color representation.

Paper Details

Date Published: 24 April 2010
PDF: 9 pages
Proc. SPIE 7672, Polarization: Measurement, Analysis, and Remote Sensing IX, 76720G (24 April 2010); doi: 10.1117/12.850604
Show Author Affiliations
Viktor Gruev, Washington Univ. in St. Louis (United States)
Rob Perkins, Washington Univ. in St. Louis (United States)
Timothy York, Washington Univ. in St. Louis (United States)

Published in SPIE Proceedings Vol. 7672:
Polarization: Measurement, Analysis, and Remote Sensing IX
David B. Chenault; Dennis H. Goldstein, Editor(s)

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