
Proceedings Paper
Infrared transfer radiometer for broadband and spectral calibration of space chambersFormat | Member Price | Non-Member Price |
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Paper Abstract
The Low-Background Infrared (LBIR) facility at NIST has recently completed construction of an infrared transfer
radiometer with an integrated cryogenic Fourier transform spectrometer (Cryo-FTS). This mobile system can be
deployed to customer sites for broadband and spectral calibrations of space chambers and low-background HWIL
testbeds. The Missile Defense Transfer Radiometer (MDXR) has many of the capabilities of a complete IR calibration
facility and will replace our existing filter-based transfer radiometer (BXR) as the NIST standard detector deployed to
MDA facilities. The MDXR features numerous improvements over the BXR, including: a cryogenic Fourier transform
spectrometer, an on-board absolute cryogenic radiometer (ACR), an internal blackbody reference, and an integrated
collimator. The Cryo-FTS can be used to measure high resolution spectra from 4 to 20 micrometers, using a Si:As
blocked-impurity-band (BIB) detector. The on-board ACR can be used for self-calibration of the MDXR BIB as well as
for absolute measurements of infrared sources. A set of filter wheels and a rotating polarizer within the MDXR allow for
filter-based and polarization-sensitive measurements. The optical design of the MDXR makes both radiance and
irradiance measurements possible and enables calibration of both divergent and collimated sources. Details of the
various MDXR components will be presented as well as initial testing data on their performance.
Paper Details
Date Published: 23 April 2010
PDF: 9 pages
Proc. SPIE 7663, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV, 76630J (23 April 2010); doi: 10.1117/12.850384
Published in SPIE Proceedings Vol. 7663:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV
James A. Buford Jr.; Robert Lee Murrer Jr., Editor(s)
PDF: 9 pages
Proc. SPIE 7663, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV, 76630J (23 April 2010); doi: 10.1117/12.850384
Show Author Affiliations
Timothy M. Jung, National Institute of Standards and Technology (United States)
Adriaan C. Carter, National Institute of Standards and Technology (United States)
Solomon I. Woods, National Institute of Standards and Technology (United States)
Adriaan C. Carter, National Institute of Standards and Technology (United States)
Solomon I. Woods, National Institute of Standards and Technology (United States)
Simon G. Kaplan, National Institute of Standards and Technology (United States)
Raju U. Datla, National Institute of Standards and Technology (United States)
Raju U. Datla, National Institute of Standards and Technology (United States)
Published in SPIE Proceedings Vol. 7663:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV
James A. Buford Jr.; Robert Lee Murrer Jr., Editor(s)
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