
Proceedings Paper
Ageing and embedding issues for high-Tc superconducting hot-electron bolometers for THz imagingFormat | Member Price | Non-Member Price |
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Paper Abstract
Superconducting hot electron bolometer (HEB) mixers are a competitive alternative to other technologies in the terahertz
frequency range because of their ultrawide bandwidth, high conversion gain, and low intrinsic noise level. A process to
fabricate stacked YBaCuO / PrBaCuO ultra-thin films (in the 15 to 40 nm range) etched to form 0.4 μm × 0.4 μm
constrictions, elaborated on MgO (100) substrates, has been previously described. HEB structures were fabricated on
such stacks, covered by log-periodic planar gold antennas, aiming at spanning the 0.9 to 7 THz range. Ageing effects
were observed, however, with the consequence of increased electrical resistance, significant degradation of the regular
bolometric response, so preventing HEB mixing action. Several measures have been attempted to address these
problems, mainly by considering the embedding technological issues related to the YBaCuO constriction electrical
coupling to the antenna and the intermediate frequency (IF) circuitry. For this purpose, the YBaCuO impedance was
analyzed, and mismatch to antenna and IF strip was considered. Besides, THz antenna simulations were performed and
validated against experiments on scaled models at GHz frequencies. Electromagnetic coupling to the incoming radiation
was also studied, including crosstalk between neighbor antennas forming a linear imaging array.
Paper Details
Date Published: 24 April 2010
PDF: 10 pages
Proc. SPIE 7671, Terahertz Physics, Devices, and Systems IV: Advanced Applications in Industry and Defense, 767103 (24 April 2010); doi: 10.1117/12.850228
Published in SPIE Proceedings Vol. 7671:
Terahertz Physics, Devices, and Systems IV: Advanced Applications in Industry and Defense
Mehdi Anwar; Nibir K. Dhar; Thomas W. Crowe, Editor(s)
PDF: 10 pages
Proc. SPIE 7671, Terahertz Physics, Devices, and Systems IV: Advanced Applications in Industry and Defense, 767103 (24 April 2010); doi: 10.1117/12.850228
Show Author Affiliations
Mario Aurino, SUPELEC, LGEP, CNRS, Univ. Paris Sud 11 (France)
Alain Martinez, SUPELEC, LGEP, CNRS, Univ. Paris Sud 11 (France)
Ibrahim Türer, SUPELEC, LGEP, CNRS, Univ. Paris Sud 11 (France)
Vishal S. Jagtap, SUPELEC, LGEP, CNRS, Univ. Paris Sud 11 (France)
Alain Martinez, SUPELEC, LGEP, CNRS, Univ. Paris Sud 11 (France)
Ibrahim Türer, SUPELEC, LGEP, CNRS, Univ. Paris Sud 11 (France)
Vishal S. Jagtap, SUPELEC, LGEP, CNRS, Univ. Paris Sud 11 (France)
Aurélie Gensbittel, SUPELEC, LGEP, CNRS, Univ. Paris Sud 11 (France)
Annick F. Dégardin, SUPELEC, LGEP, CNRS, Univ. Paris Sud 11 (France)
Alain J. Kreisler, SUPELEC, LGEP, CNRS, Univ. Paris Sud 11 (France)
Annick F. Dégardin, SUPELEC, LGEP, CNRS, Univ. Paris Sud 11 (France)
Alain J. Kreisler, SUPELEC, LGEP, CNRS, Univ. Paris Sud 11 (France)
Published in SPIE Proceedings Vol. 7671:
Terahertz Physics, Devices, and Systems IV: Advanced Applications in Industry and Defense
Mehdi Anwar; Nibir K. Dhar; Thomas W. Crowe, Editor(s)
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