Share Email Print

Proceedings Paper

MAPPER: high-throughput maskless lithography
Author(s): M. J. Wieland; G. de Boer; G. F. ten Berge; M. van Kervinck; R. Jager; J. J. M. Peijster; E. Slot; S. W. H. K. Steenbrink; T. F. Teepen; B. J. Kampherbeek
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

MAPPER Lithography is developing a maskless lithography technology based on massively-parallel electron-beam writing with high speed optical data transport for switching the electron beams. In this way optical columns can be made with a throughput of 10-20 wafers per hour. By clustering several of these systems together high throughputs can be realized in a small footprint. This enables a highly cost-competitive alternative to double patterning and EUV alternatives[1]. In 2009 MAPPER shipped two systems one to TSMC and one to CEA-Leti. Both systems will be used to verify the applicability of MAPPER's technology for CMOS manufacturing. This paper presents a status update on the development of the MAPPER system over the past year. First an overview will be presented how to scale the current system to a 10 wph machine which can consequently be used in a cluster configuration to enable 100 wph throughputs. Then the results of today's (pre-) alpha systems with 300 mm wafer capability are presented from the machines at MAPPER, TSMC and CEA-Leti.

Paper Details

Date Published: 1 April 2010
PDF: 10 pages
Proc. SPIE 7637, Alternative Lithographic Technologies II, 76370F (1 April 2010); doi: 10.1117/12.849480
Show Author Affiliations
M. J. Wieland, MAPPER Lithography B.V. (Netherlands)
G. de Boer, MAPPER Lithography B.V. (Netherlands)
G. F. ten Berge, MAPPER Lithography B.V. (Netherlands)
M. van Kervinck, MAPPER Lithography B.V. (Netherlands)
R. Jager, MAPPER Lithography B.V. (Netherlands)
J. J. M. Peijster, MAPPER Lithography B.V. (Netherlands)
E. Slot, MAPPER Lithography B.V. (Netherlands)
S. W. H. K. Steenbrink, MAPPER Lithography B.V. (Netherlands)
T. F. Teepen, MAPPER Lithography B.V. (Netherlands)
B. J. Kampherbeek, MAPPER Lithography B.V. (Netherlands)

Published in SPIE Proceedings Vol. 7637:
Alternative Lithographic Technologies II
Daniel J. C. Herr, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?