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Proceedings Paper

Non-linear interactions in electromagnetically induced transparency and related pump-probe optical phenomena in moving atomic systems
Author(s): Verne L. Jacobs
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Paper Abstract

Linear and non-linear interactions in electromagnetically induced transparency and related pump-probe optical phenomena involving moving many-electron atomic systems are investigated using a reduced-density-matrix approach. Time-domain (equation-of-motion) and frequency-domain (resolvent-operator) formulations are developed in a unified manner. The standard Born (lowest-order perturbation-theory) and Markov (short-memory-time) approximations are systematically introduced within the framework of the general non-perturbative and non-Markovian formulations. A preliminary semiclassical perturbation-theory treatment of the electromagnetic interaction is adopted. However, it is emphasized that a quantized-electromagnetic-field approach is essential for a self-consistent quantum-mechanical formulation. Our primary result is the derivation of compact Liouville-space operator expressions for the linear and the general (n'th order) non-linear macroscopic electromagnetic-response tensors. These expressions can be evaluated for coherent initial atomic excitations and for the full tetradic-matrix form of the Liouville-space self-energy operator representing the environmental interactions in the Markov approximation. Collisional interactions between atoms can be treated in various approximations for the self-energy operator, and the influence of Zeeman coherences on the electromagnetic-pulse propagation can be investigated by including an applied magnetic field on an equal footing with the electromagnetic fields.

Paper Details

Date Published: 11 February 2010
PDF: 12 pages
Proc. SPIE 7612, Advances in Slow and Fast Light III, 76120K (11 February 2010); doi: 10.1117/12.848648
Show Author Affiliations
Verne L. Jacobs, U.S. Naval Research Lab. (United States)

Published in SPIE Proceedings Vol. 7612:
Advances in Slow and Fast Light III
Selim M. Shahriar; Philip R. Hemmer, Editor(s)

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