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Proceedings Paper

ALOS PALSAR differential interferometry for mapping co-seismic deformation of the 2008 Wenchuan earthquake, China
Author(s): Yunfeng Hu; Yifang Ban; Jiyuan Liu
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Paper Abstract

Differential interferometric synthetic aperture radar (DInSAR) technique has been widely accepted as a powerful tool to map surface deformation. To quantitatively evaluate the surface displacement caused by Wenchuan Earthquake on 12 May 2008 in Sichuan Province, China, a series of interferograms were generated from 25 ALOS/PALSAR image pairs, and the surface displacement was then mapped. According to the wrapped differential interferogram, the main rupture fault was plotted with an orientation of North-East 47° and a spanning length of approximately 230 km. The serious affected region with area of 5,000 km2 and the affected region with area of 250,000 km2 were also mapped. Along the radar look of sight (LOS), it is estimated that the ground surface displaced approximated a maximum of 57 cm and 119 cm away from and towards the satellite respectively, i.e. the vertical displacement was a maximum of 73 cm and 150 cm down lift and uplift respectively. The capability of DInSAR technique and ALOS PALSAR data for co-seismic deformation mapping has been demonstrated and proved to be useful in the surface deformation applications. In addition, some limitations were discussed including the topographic, atmospheric, and orbital errors.

Paper Details

Date Published: 9 October 2009
PDF: 8 pages
Proc. SPIE 7471, Second International Conference on Earth Observation for Global Changes, 74711A (9 October 2009); doi: 10.1117/12.847906
Show Author Affiliations
Yunfeng Hu, Royal Institute of Technology (Sweden)
Institute of Geographical Sciences and Natural Resources Research, CAS (China)
Yifang Ban, Royal Institute of Technology (Sweden)
Jiyuan Liu, Institute of Geographic Sciences and Natural Resources Research, CAS (China)

Published in SPIE Proceedings Vol. 7471:
Second International Conference on Earth Observation for Global Changes
Xianfeng Zhang; Jonathan Li; Guoxiang Liu; Xiaojun Yang, Editor(s)

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