Share Email Print

Proceedings Paper

Damage testing of EUV optics and sensors using focused radiation from a table-top LPP source
Author(s): Klaus Mann; Frank Barkusky; Armin Bayer; Bernhard Flöter; Peter Grossmann
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

We present first damage threshold investigations on EUV mirrors and substrate materials using a table-top laser produced plasma source. A Schwarzschild objective with Mo/Si multilayer coatings for the wavelength of 13.5 nm was adapted to the source, generating an EUV spot of 5 μm diameter with a maximum energy density of ~6.6 J/cm2. Singlepulse damage tests were performed on grazing incidence gold mirrors, Mo/Si multilayer mirrors and mirror substrates, respectively. For gold mirrors, a film thickness dependent damage threshold is observed, which can be partially explained by a thermal interaction process. For Mo/Si multilayer mirrors two damage regimes (spot-like, crater) were identified. Fused silica exhibits very smooth ablation craters, indicating a direct photon-induced bond breaking process. Silicon shows the highest damage threshold of all investigated substrate and coating materials. The damage experiments on substrates (fused silica, silicon, CaF2) were compared to excimer laser ablation studies at 157 nm.

Paper Details

Date Published: 22 March 2010
PDF: 9 pages
Proc. SPIE 7636, Extreme Ultraviolet (EUV) Lithography, 76362O (22 March 2010); doi: 10.1117/12.846926
Show Author Affiliations
Klaus Mann, Laser-Lab. Göttingen e.V. (Germany)
Frank Barkusky, Laser-Lab. Göttingen e.V. (Germany)
Armin Bayer, Laser-Lab. Göttingen e.V. (Germany)
Bernhard Flöter, Laser-Lab. Göttingen e.V. (Germany)
Peter Grossmann, Laser-Lab. Göttingen e.V. (Germany)

Published in SPIE Proceedings Vol. 7636:
Extreme Ultraviolet (EUV) Lithography
Bruno M. La Fontaine, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?