Share Email Print

Proceedings Paper

Iterative procedure for in-situ optical testing with an incoherent source
Author(s): Ryan Miyakawa; Patrick Naulleau; Avideh Zakhor; Ken Goldberg
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Interferometry, the long-standing method for optical characterization, is difficult to perform at EUV wavelengths due to the lack of high power coherent EUV sources and difficult experimental setup. These problems are exacerbated by systematic errors from geometrical effects as EUV tools move to higher numerical apertures (NA) which require stricter tolerances for the optical elements involved in interferometry. In this paper we propose an iterative, image-based, in-situ method for optical characterization that is independent of the operating wavelength of light, illumination coherence, and NA of the system. In this method, a known pattern is imaged through focus, and matched to an experimental model with a trial set of pupil aberrations. The aberrations are then changed iteratively until the modeled images match the ones from the experiment. The Reduced Optical Coherent Sum (ROCS) decomposition for partially coherent aerial image calculation greatly reduces the computation time of each iteration which makes this method more computationally tractable.

Paper Details

Date Published: 22 March 2010
PDF: 7 pages
Proc. SPIE 7636, Extreme Ultraviolet (EUV) Lithography, 76361K (22 March 2010); doi: 10.1117/12.846235
Show Author Affiliations
Ryan Miyakawa, Univ. of California, Berkeley (United States)
Patrick Naulleau, Lawrence Berkeley National Lab. (United States)
Avideh Zakhor, Univ. of California, Berkeley (United States)
Ken Goldberg, Lawrence Berkeley National Lab. (United States)

Published in SPIE Proceedings Vol. 7636:
Extreme Ultraviolet (EUV) Lithography
Bruno M. La Fontaine, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?