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Proceedings Paper

Experimental approach to ultrafast optical spin echo of a single quantum dot electron spin
Author(s): Kristiaan De Greve; David Press; Thaddeus D. Ladd; Benedikt Friess; Peter l. McMahon; Christian Schneider; Martin Kamp; Sven Hoefling; Alfred Forchel; Yoshihisa Yamamoto
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Paper Abstract

The phase coherence of a physical qubit is essential for quantum information processing, motivating fast control methods to preserve that phase. Ultrafast optical techniques allow complete spin control to be performed on a much faster timescale than microwave or electrical control (ps vs. ns at best). Using our ultrafast control techniques, we demonstrate our experimental approach towards a spin echo sequence on the spin of a single electron confined in a semiconductor quantum dot (QD), increasing the observed decoherence time of a single QD electron spin from nanoseconds to several microseconds. The ratio of the observed decoherence time to the demonstrated single-qubit gate time exceeds 105, suggesting strong promise for future quantum information processors.

Paper Details

Date Published: 15 February 2010
PDF: 12 pages
Proc. SPIE 7611, Advances in Photonics of Quantum Computing, Memory, and Communication III, 76110K (15 February 2010); doi: 10.1117/12.843667
Show Author Affiliations
Kristiaan De Greve, Stanford Univ. (United States)
David Press, Stanford Univ. (United States)
Thaddeus D. Ladd, Stanford Univ. (United States)
National Institute of Informatics (Japan)
Benedikt Friess, Stanford Univ. (United States)
Univ. Würzburg (Germany)
Peter l. McMahon, Stanford Univ. (United States)
Christian Schneider, Univ. Würzburg (Germany)
Martin Kamp, Univ. Würzburg (Germany)
Sven Hoefling, Univ. Würzburg (Germany)
Alfred Forchel, Univ. Würzburg (Germany)
Yoshihisa Yamamoto, Stanford Univ. (United States)
National Institute of Informatics (Japan)

Published in SPIE Proceedings Vol. 7611:
Advances in Photonics of Quantum Computing, Memory, and Communication III
Zameer U. Hasan; Alan E. Craig; Philip R. Hemmer; Charles M. Santori, Editor(s)

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