Share Email Print

Proceedings Paper

Reliable operation of 8xx mini-bar-based hermetic modules
Author(s): Xu Jin; Serge Cutillas; Daming Liu; Ed Wolak; Sang-Ki Park; Kelly Johnson; Terry Towe; Dino Lenarduzzi; Touyen Nguyen; Tom Truchan; Jeff Mott; James Harrison; Andrea Guarino; Jürgen Müller; Susanne Pawlik; Boris Sverdlov; Norbert Lichtenstein; Chris Button
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In this work we show that mini-bar-based 8xx products show the reliability characteristics of independent emitter failures and "non-degrading" drift plots similar to those of their 9xx counterparts. This fact is in part an outcome of the bonding process and heat-sink design. Multi-cell life testing gives projected reliable operation of compact, fiber-coupled modules (200-μm-diameter, 0.15 NA) at 30 W and 808 nm, with 35 W at 880 nm.

Paper Details

Date Published: 17 February 2010
PDF: 8 pages
Proc. SPIE 7583, High-Power Diode Laser Technology and Applications VIII, 758306 (17 February 2010); doi: 10.1117/12.842838
Show Author Affiliations
Xu Jin, Oclaro, Inc. (United States)
Serge Cutillas, Oclaro, Inc. (United States)
Daming Liu, Oclaro, Inc. (United States)
Ed Wolak, Oclaro, Inc. (United States)
Sang-Ki Park, Oclaro, Inc. (United States)
Kelly Johnson, Oclaro, Inc. (United States)
Terry Towe, Oclaro, Inc. (United States)
Dino Lenarduzzi, Oclaro, Inc. (United States)
Touyen Nguyen, Oclaro, Inc. (United States)
Tom Truchan, Oclaro, Inc. (United States)
Jeff Mott, Oclaro, Inc. (United States)
James Harrison, Oclaro, Inc. (United States)
Andrea Guarino, Oclaro Switzerland AG (Switzerland)
Jürgen Müller, Oclaro Switzerland AG (Switzerland)
Susanne Pawlik, Oclaro Switzerland AG (Switzerland)
Boris Sverdlov, Oclaro Switzerland AG (Switzerland)
Norbert Lichtenstein, Oclaro Switzerland AG (Switzerland)
Chris Button, Oclaro Technology plc (United Kingdom)

Published in SPIE Proceedings Vol. 7583:
High-Power Diode Laser Technology and Applications VIII
Mark S. Zediker, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?