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Proceedings Paper

Multiwavelength optical fiber refractive index profiling
Author(s): Andrew D. Yablon
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Paper Abstract

Fourier transform spectroscopy and interference microscopy are combined to provide the world's first multi-wavelength optical fiber refractive index profile (RIP) measurements. The RIP and its spectral dependence are obtained with submicron spatial resolution across an octave stretching from about 500 nm to the 1 micron operating band of Yb-doped fiber lasers and amplifiers. In contrast to commercial Refracted Near Field (RNF) technology, which measures at a cleave, the technique described here measures transversely through the side of an uncleaved fiber, enabling measurements of axial fiber RIP variations found in fiber gratings, physical tapers, and fusion splices.

Paper Details

Date Published: 17 February 2010
PDF: 8 pages
Proc. SPIE 7580, Fiber Lasers VII: Technology, Systems, and Applications, 758015 (17 February 2010); doi: 10.1117/12.841883
Show Author Affiliations
Andrew D. Yablon, Interfiber Analysis (United States)

Published in SPIE Proceedings Vol. 7580:
Fiber Lasers VII: Technology, Systems, and Applications
Kanishka Tankala, Editor(s)

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