
Proceedings Paper
Investigation on production of highly textured Sb doped polycrystalline silicon using solid state Nd:YAG laser for photovoltaic applicationFormat | Member Price | Non-Member Price |
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Paper Abstract
Efficient doping of amorphous silicon(a-Si) is a key issue in the field of photovoltaic applications. In this paper an
attempt has been made to produce a highly highly textured Sb doped a-Si. The a-Si were coated with Sb to a thickness
of 200nm using vacuum evaporation method and treated with an Nd:YAG laser of 355nm with a threshold fluence of
460mJ/cm2 by overlapping the laser spots to 90% of its size. The samples are retretaed with a low laser fluence of
230mJ/cm2 respectively so as to crytsallize and diffuse the Sb on to the surface and to activate the dopant. The laser
doped and subequently laser textured samples were analysed through Scanning Electron microscope (SEM), X-ray
diffraction (XRD) & Atomic Force Microscope(AFM).The traces of SiSb in the XRD peak with improved surface
roughness were observed on the laser doped samples. This represents that the dopants are highly diffused on the a-Si.
Paper Details
Date Published: 17 February 2010
PDF: 8 pages
Proc. SPIE 7584, Laser Applications in Microelectronic and Optoelectronic Manufacturing XV, 758410 (17 February 2010); doi: 10.1117/12.841105
Published in SPIE Proceedings Vol. 7584:
Laser Applications in Microelectronic and Optoelectronic Manufacturing XV
Hiroyuki Niino; Michel Meunier; Bo Gu; Guido Hennig; Jan J. Dubowski, Editor(s)
PDF: 8 pages
Proc. SPIE 7584, Laser Applications in Microelectronic and Optoelectronic Manufacturing XV, 758410 (17 February 2010); doi: 10.1117/12.841105
Show Author Affiliations
I. A. Palani, Indian Institute of Technology Madras (India)
N, J. Vasa, Indian Institute of Technology Madras (India)
N, J. Vasa, Indian Institute of Technology Madras (India)
Published in SPIE Proceedings Vol. 7584:
Laser Applications in Microelectronic and Optoelectronic Manufacturing XV
Hiroyuki Niino; Michel Meunier; Bo Gu; Guido Hennig; Jan J. Dubowski, Editor(s)
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