
Proceedings Paper
SoPC implementation of combined real-time non-uniformity correction of IRFPAFormat | Member Price | Non-Member Price |
---|---|---|
$17.00 | $21.00 |
Paper Abstract
With the increase of pixel density and scale of IRFPA (Infrared Focal Plane Array), NUC (Non-Uniformity Correction)
technology becomes more and more important to access high quality infrared images. However, traditional one-point or
two-point NUC methods based on calibration technology can't achieve ideal performance because they can't overcome
the non-linearity and drift of the detector response parameters in both spatial and temporal regions effectively. A novel
combined real-time non-uniformity correction method is proposed based on FPGA (Field Programmable Gate Array)
technology, which adopts SoPC (System-on-a-Programmable Chip) architecture based on Nios II processor core to
implement the total NUC processing functions inside only one chip. The NUC processing chooses the reference-based
binomial fitting algorithm to remove the main non-uniformity of the detector, and the remained non-uniformity is
compensated by using the improved scene-based temporal high-pass filter algorithm. The experiment results show that
the combined method based on SoPC architecture can access the ideal efforts with IRFPA size of 320×240×14bit @ 25
frames per second. The block diagram of hardware circuit and the processing flow are described in details.
Paper Details
Date Published: 24 November 2009
PDF: 8 pages
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130T (24 November 2009); doi: 10.1117/12.840090
Published in SPIE Proceedings Vol. 7513:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)
PDF: 8 pages
Proc. SPIE 7513, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology, 75130T (24 November 2009); doi: 10.1117/12.840090
Show Author Affiliations
Kun Gao, Beijing Institute of Technology (China)
Zhao-jun Nie, Beijing Institute of Technology (China)
Zhao-jun Nie, Beijing Institute of Technology (China)
Hu Yang, Beijing Institute of Technology (China)
Guoqiang Ni, Beijing Institute of Technology (China)
Guoqiang Ni, Beijing Institute of Technology (China)
Published in SPIE Proceedings Vol. 7513:
2009 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Process Technology
Toru Yoshizawa; Ping Wei; Jesse Zheng, Editor(s)
© SPIE. Terms of Use
